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◈ date : 2015/08/03
◈ time : 6:00 ~8:00 pm
◈ place : 7th building 5nd floor no. 502
◈ presenter : Jungmin Han , Heesung Lee
◈ book :
-SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION
-DIETER K.SCHRODER
ch 6. Oxide and Interface Trapped Charges, Oxide Thickness
presenter : Jungmin Han
6.1 Introduction,
6.2 Fixed, Oxide Trapped, and Mobile Oxide Charge
6.3.1 Low Frequency (Quasi-static) Methods
presenter : Heesung Lee
6.3 Interface Trapped Charge
6.4 Oxide Thickness
6.5 Strengths and Weaknesses
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