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◈ date : 2016/02/16
◈ time : 6:00 ~8:00 pm
◈ place : 7th building 2nd floor no. 234
◈ presenter : Daehyun Ko, Seong Kwang Kim
◈ book :MOSFET MODELING FOR VLSI SIMULATION THEORY AND PRACTICE
-NARAIN ARORA
ch 6. MOSFET DC Model
presenter : Daehyun Ko
6.7 Short-Geometry Models
6.8 Impact of Source-Drain Resistance on Drain Current
6.9 Temperature Dependence of the Drain Current
presenter : Seong Kwang Kim
8.4 Mechanism of MOSFET Degradation
8.5 Measure of Degradation-Device Lifetime
8.6 Impact of Degradation on Circuit Performance
8.7 Temperature Dependence of Device Degradation
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