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[Paper seminar] Notice of the paper seminar ('16. 2. 20)
김재원 Hits:2303 210.123.42.187
2016-02-15 18:27:59
◈ time :  A.M. 09:00
◈ place : 7th building 2th floor no. 234
◈ presenter : Bongsik Choi
◈ papers 
Title :TCAD Simulation of Data Retention Characteristics of Charge Trap Device
         for 3-D NAND Flash Memory
 Group : R&D Division, SK hynix Inc.
◈ papers information : 

Dongyean Oh, et al., “TCAD Simulation of Data Retention Characteristics of Charge Trap Device for 3-D NAND Flash Memory,” Memory Workshop (IMW), 2015 IEEE International, 2015.

 

◈ presenter : Jaewon Kim
◈ papers 
Title : A Simple Series Resistance Extraction Methodology for Advanced
          CMOS Devices
Group: Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA.
◈ papers information : 

J.P. Campbell, et al., “A Simple Series Resistance Extraction Methodology for Advanced CMOS Devices,” IEEE Electron Device Letters, vol. 32, no. 8, pp. 1047-1049,  Aug. 2011.

 

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