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Dongyean Oh, et al., “TCAD Simulation of Data Retention Characteristics of Charge Trap Device for 3-D NAND Flash Memory,” Memory Workshop (IMW), 2015 IEEE International, 2015.
J.P. Campbell, et al., “A Simple Series Resistance Extraction Methodology for Advanced CMOS Devices,” IEEE Electron Device Letters, vol. 32, no. 8, pp. 1047-1049, Aug. 2011.
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