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◈ time : A.M. 08:00
◈ place : 7th building 2th floor no. 234
◈ presenter : Hara Kang
◈ papers
Title : Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy
Group : 1. Electrical Engineering Division, Department of Engineering, University of Cambridge. 2. Department of Applied Physics, Korea University.
◈ papers information : S. Lee, et al. "Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy," Scientific Reports 5, 14902, (2015)
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