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◈ date : 2015/07/13
◈ time : 9:00 ~11:00
◈ place : 7th building 5nd floor no. 502
◈ presenter : Seong Kwang Kim
◈ book :
-SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION
-DIETER K.SCHRODER
3. Contact resistance and schottky barriers
3.1 Introduction
3.2 Metal-semiconductor contacts.
3.3 Contact resistance
3.4 Measurement techniques
3.5 Schottky barrier height
3.6 Comparison of methods
3.7 Strengths and weaknesses
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