◈ date : 2015/07/27
◈ time :  6:00 ~8:00 pm
◈ place : 7th building 5nd floor no. 502
◈ presenter : Jungkyu Jang , Hara Kang
◈ book :
-SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION 
-DIETER K.SCHRODER

ch 5. Defects

presenter : Jungkyu Jang

5.1 Introduction
5.2 Generation-Recombination statistics
5.3 Capacitance measurement
5.4 Current measurement
5.5 Charge measurement

presenter : Hara Kang

5.6 Deep-level transient spectrocopy (DLTS)

5.7 Thermally simulated capacitance and current
5.8 Positron Annihilation spectroscopy (PAS)
5.9 Strength and weaknesses