Prof. Kim`s R.P.

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  • 52 J.-H. Park, K. Jeon, S. Lee, S. Kim, S. Kim, I. Song, J. Park, Y. Park, C. J. Kim, D. M. Kim, and D. H. Kim "Self-Consistent Technique for Extracting Density of States in Amorphous InGaZnO Thin Film Transistors" Journal of The Electrochemichal Society, vol. 157, no. 3, pp. h272-h277, 2010-01 PDF
  • 51 J. Jang, C. Choi, J.-S. Lee, K.-S. Min, J.-G. Lee, D. M. Kim, and D. H. Kim "Design of gate stacks for improved program/erase speed, retention and process margin aiming next generation metal nanocrystal memories" Semicond. Sci. Technol., vol. 24 , pp. 115009, 2009-10 PDF
  • 50 J. Lee, C. Choi, S. Park, I.-Y. Chung, C.-J. Kim, B.-G. Park, D. M. Kim, and D. H. Kim "Ultra-energy-efficient analog-to-digital converters based on single-electron transistor/CMOS hybrid technology for biomedical applications" Semicond. Sci. Technol., vol. 24 , pp. 115007, 2009-10 PDF
  • 49 J.-H. Park, S. Lee, K. Jeon, S. Kim, S. Kim, J. Park, I. Song, C. J. Kim, Y. Park, D. M. Kim, and D. H. Kim "Density of States-Based DC I-V Model of Amorphous Gallium-Indium-Zinc-Oxide Thin-Film Transistors" IEEE Electron Device Letters., vol. 30, no. 10, pp. 1069-1071, 2009-10 PDF
  • 48 S. Lee, K. Jeon, J.-H. Park, S. Kim, D. Kong, D. M. Kim, D. H. Kim, S. Kim, S. Kim, J. Hur, J. C. Park, I. Song, C. J. Kim, Y. Park, and U.-I. Jung "Electrical stress-induced instability of amorphous indium-gallium-zinc oxide thin-film transistors under bipolar ac stress" Appl. Phys. Lett., vol. 95, pp. 132101-1-132101-3, 2009-09 PDF
  • 47 K.-S. Roh, S. Park, D. H. Kim, and D. M. Kim "Lateral Trapped-Charge Profiling Based on the Extraction of the Flat Band Voltage by using the Optical Substrate Current in Nitride-Based Charge-Trap Flash Memories" IEEE Transactions on Electron Devices, vol. 56, no. 9, pp. 2034-2044, 2009-09 PDF
  • 46 C. Choi, J. Lee, S. Park, I.-Y. Chung, C.-J. Kim, B.-G. Park, D. M. Kim,and D. H. Kim "Comparative study on the energy efficiency of logic gates based onsingle-electron transistor technology" Semicond. Sci. Technol., vol. 24, no. 6, pp. 065007, 2009-05 PDF
  • 45 D. S. Lee, S. Kang, K.-C. Kang, J.-E. Lee, J. H. Lee, K.-J. Song, D. M. Kim, J. D. Lee and B.-G. Park "Fabrication and Characteristics of Self-Aligned Dual-Gate Single-Electron Transistors" IEEE Trans. Nanotechnology, vol. 8, no. 4, pp. 492-497, 2009-07 PDF
  • 44 S. R. Park, K. Y. Kim, C. Choi, K.-J. Song, J.-H. Park, K. Jeon, S. Lee, T. Y. Kim, J. E. Lee, S, Lee, S. Park, J. Jang, D. M. Kim and D. H. Kim "Comparative Study on Program/Erase Efficiency and Retention Properties of 3-D SONOS Flash Memory Cell Array Transistors : Structural Approach from Double-Gate FET and FinFET to Gate-All-Around FET" Journal of Korean Physical Society, vol. 54, no. 5, pp. 1854-1861, 2009-05 PDF
  • 43 K. Jeon, S. Lee, J.-H. Park ,C. Choi, K.-J. Song, S. R. Park, T. Y. Kim, J. E. Lee, S. Park, S. Lee, J. Jang, D. H. Kim, and D. M. Kim "Optical Charge Pumping Method for Extracting the Energy Level of Interface States in Program/Erase Cycled SONOS Flash Memory Cell and Its Program Time Dependence" Journal of Korean Physical Society, vol. 54, no 5, pp. 1862-1867, 2009-05 PDF
  • 42 K. S. Roh, S. Park, K.-J. Song, J.-H. Park, S. Lee, C. Choi, K. Jeon, S. R. Park, T. Y. Kim, J. E. Lee, S. Lee, J. Jang, D. H. Kim, and D. M. Kim "Lateral Trapped Charge Profiling Based on the Extraction of Flat Band Voltage by using the Optical Substrate Current in Charge Trapping Flash Memory Cells" Journal of Korean Physical Society, vol. 54, no. 5, pp. 1848-1853, 2009-05 PDF
  • 41 J.-H. Park, K. Jeon, S. Lee, S. Kim, S. Kim, I. Song, C. J. Kim, J. Park, Y. Park, D. M. Kim, and D. H. Kim "Extraction of Density of States in Amorphous GaInZnO Thin Film Transistors by Combining an Optical Charge Pumping and Capacitance-Voltage Characteristics" IEEE Electron Device Letters., vol. 29, pp.1292-1295, 2008-12 PDF
  • 40 K. Jeon, C. Kim, I. Song, J. Park, S. Kim, S. Kim, Y. Park, J.-H. Park, S. Lee, D. M. Kim, and D. H. Kim "Modeling of amorphous InGaZnO thin-film transistors based on the density of states extracted from the optical response of capacitance-voltage characteristics" Appl. Phys. Lett., vol. 93, pp. 182102, 2008-11 PDF
  • 39 S. H. Seo, G.-C. Kang, K. S. Roh, K. Y. Kim, S. Lee, K.-J. Song, C. M. Choi, S. R. Park, K. Jeon, J.-H. Park, B.-G. Park, J. D. Lee, D. M. Kim, and D. H. Kim "Dynamic Bias Temperature Instability-like Behaviors under Fowler-Nordheim Program/Erase Stress in Nanoscale Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) Memories" Appl. Phys. Lett., vol. 92, pp. 133508-133510, 2008-04 PDF
  • 38 S. W. Kim, K. S. Roh, S. H. Seo, K. Y. Kim, G. C. Kang, S. Lee, C. M. Choi, S. R. Park, J. H. Park, K. C. Chun, K. J. Song, D. H. Kim and D. M. Kim "Extraction of interface states at emitter-base heterojunctions in AlGaAs/GaAs heterostructure bipolar transistors using sub-bandgap photonic excitation" Microelectronics Reliability, vol 48, issue 3, pp. 382-388, 2008-03 PDF
  • 37 S. H. Seo, S. W. Kim, J.-U. Lee, G.-C. Kang, K. S. Roh, K. Y. Kim, S. Lee, C. M. Choi, K.-J. Song, S. R. Park, J.-H. Park, K. Jeon, D. M. Kim, and D. H. Kim "Investigation of Channel Width Dependence of CHEI Program / HHI Erase Cycling Behavior in Nitride-based Charge-Trapping Flash (CTF) Memory Devices" Journal of Korean Physical Society, vol. 52, pp. 481-486, 2008-02 PDF
  • 36 J.-G. Lee, D. H. Kim, J. G. Lee, D. M. Kim and K.-S. Min "A compact HSPICE macromodel of resistive RAM" IEICE Electron. Express, vol. 4, no. 19, pp. 600-605, 2007-10 PDF
  • 35 D. M. Kim, D. H. Kim, S. Y. Lee "Characterization and modeling of temperature-dependent barrier heights and ideality factors in GaAs Schottky diodes" Solid-State Electronics, vol. 51, pp. 865-869, 2007-01 PDF
  • 34 C. H. Lee, S. W. Kim, J. U. Lee, S. H. Seo, G.-C. Kang, K. S. Roh, K. Y. Kim, S. Y. Lee, D. M. Kim, and D. H. Kim "Design of a robust analog-to-digital converter based on complementary SET/CMOS hybrid amplifier" IEEE Trans. Nanotechnology, vol. 6, no. 6, 2007-11 PDF
  • 33 J. U. Lee, K. S. Roh, G. C. Kang, S. H. Seo, K. Y. Kim, S. Lee, K. J. Song, C. M. Choi, S. R. Park, J. H. Park, K. C. Jeon, D. H. Kim, and D. M. Kim "Optical capacitance-voltage characterization of charge traps in the trapping nitride layer of charge trapped flash memory devices" Appl. Phys. Lett., vol. 91, ,pp. 223511, 2007-11 PDF