13D. H. Kim, W. Kim, Y. Kim, I. Hur, M. Bae, D. Kong, H. K. Jeong, D. M. Kim"Physical Model and Simulation Platform for High-Level Instability-Aware Design of Amorphous Oxide Semiconductor Thin-Film Transistors"in SID'12 Dig. Tech. Papers, 2012-05
12Y.-S. Kim, H.-H. Nahm, and D. H. Kim"Microscopic Mechanism of the Negative Bias and Illumination Stress Instability of Amorphous Oxide TFTs"in SID'12 Dig. Tech. Papers, 2012-05
11H. K. Jeong, I. Hur, W. Kim, J. Kim, D. Kong, Y. Kim, M. Bae, S. Choi, D. M. Kim, and D. H. Kim"Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors"in SID'12 Dig. Tech. Papers, 2012-05
10J. S. Shin, H. Choi, H. Bae, J. Jang, D. Yun, E. Hong, H. Seo, D. H. Kim, and D. M. Kim"Si/SiGe Vertical Gate DHBT (VerDHBT)-based 1T DRAM Cell For Improved Retention Characteristics With a Large Hysteresis window"The 19th Korean Conference on Semiconductors, 2012-02
9J. S. Shin, H. Bae, E. Hong, J. Jang, D. Yun, H. Seo, H. Choi, D. H. Kim, and D. M. Kim"Separate Extraction Technique of Gate, Source, Drain, and Substrate Resistances in Individual MOSFET Combining I-V and C-V Characteristics"The 19th Korean Conference on Semiconductors, 2012-02
8M. Bae, D. Yun, Y. Kim, D. Kong, H. Jeong, J. Jang, W. Kim, I. Hur, J. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. H. Kim, and D. M. Kim"Differential Ideality Factor Technique and Extraction of Subgap Density-of-States in Amorphous InGaZnO Thin-Film Transistors"The 19th Korean Conference on Semiconductors, 2012-02
7J. Lee, J. H. Lee, H. Jang, M. Uhm, W. H. Lee, S. Hwang, B.-G. Park, I.-Y. Chung, D. M. Kim and D. H. Kim"CMOS-Compatible Inverter-Type Si Nanoribbon Biosensor with High Sensitivity"The 19th Korean Conference on Semiconductors, 2012-02
6J. Kim, J. Jang, M. Bae, W. Kim, I. Hur, Y. Kim, H. Jeong, D. Kong, J. Lee, Y. H. Kim, S. Jun, C. H. Jo, D. M. Kim,and D. H. Kim"Characterization of Density-of-States in olymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator"The 19th Korean Conference on Semiconductors, 2012-02
5I. Hur, H. Bae, M. Bae, Y. Kim, D. Kong, H. Jeong, J. Jang, J. Kim, W. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. M. Kim, and D. H. Kim"Characterization of Intriinsic Field Effect Mobiliity in a-IGZO Thin-Film Transistors Through the De-embedding the Parasitic Source and Drain Resistance Effects"The 19th Korean Conference on Semiconductors, 2012-02
4정현광, 공동식, 김용식, 배민경, 김재형, 김우준, 허인석, 이재욱, 김윤혁, 전성우, 조춘형, 김동명, 김대환"Amorphous Silicon 박막트랜지스터의 Negative Bias Illumination Stress 하에서의 물리적 Parameter 기반 신뢰성 특성 분석"The 19th Korean Conference on Semiconductors, 2012-02
3김우준, 배민경, 김용식, 김재형, 허인석, 장재만, 정현광, 공동식, 김윤혁 이재욱, 조춘형, 전성우, 김동명, 김대환"Analytical Model-based SPICE Simulation ofr the Design of Amorphous InGaZnO Thin-Film Transistors-based Circuits"The 19th Korean Conference on Semiconductors, 2012-02
2H. Bae, D. Kong, J. S. Shin, D. Yun, E. Hong, H. Seo, H. Choi, J. Lee, H.-K. Jung, M. Bae, Y. Kim, W. Kim, D. H. Kim, and D. M. Kim"Active Layer Thickness-Dependent Parasitic Resistance Effect in Low Frequency Noise with Subgap Density-of-States in Amorphous Indium-Gallium-Zinc-Oxide TFTs"The 19th Korean Conference on Semiconductors, 2012-02
1J. H. Lee, J. Lee, M-C Sun, W. H. Lee, M Uhm, S. Hwang, I-Y Chung, D. M. Kim, D. H. Kim, and B-G Park"Analysis of hysteresis characteristics of fabricated SiNW biosensor in aqueous environment with reference electrode"Silicon Nanoelectronics Workshop (SNW), 2012 IEEE Digital Object Identifier, 2012-