Prof. Kim`s R.P.

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  • 96 J. Lee, J. H. Lee, M. Uhm, W. H. Lee, S. Hwang, B. S. Choi, B. -G. Park ,D. M. Kim, and D. H. Kim "Implementation and Characterization of Gate-Induced Drain Leakage Current-Based Multiplexed SiNW Biosensor" The 20th Korean Conference on Semiconductors, 2013-02 PDF
  • 95 J. Jang, J. Kim, J. Lee, H. Kim, D. M. Kim, and D. H. Kim "Density-of-States (DOS)-based I-V and C-V Models and Link to Circuit Simulator for Polymer Thin Film Transistors (PTFTs)" The 20th Korean Conference on Semiconductors, 2013-02 PDF
  • 94 W. H. Lee, J.-M. Lee, M. Uhm, J. Lee, J. H. Lee, H. Bae, E. Hong, S. Hwang, Y. H. Kim, B. S. Choi, B.-G. Park, D. M. Kim, Y.-J. Jeong, and D. H. Kim "Characterization of Subthreshold Slope Degradation in CMOS-based Silicon Nanowire Biosensors" The 20th Korean Conference on Semiconductors, 2013-02 PDF
  • 93 C. Jo, S. Jun, W. Kim, I. Hur, J. Jang, J. Kim, J. Lee, Y. H. Kim, H. Bae, D. J. Shin, K. M. Lee, H. Kim, D. H. Kim, and D. M. Kim "Characterization of Negative Bias Stress Instability Mechanisms in Amorphous InGaZnO Thin Film Transistors" The 20th Korean Conference on Semiconductors, 2013-02 PDF
  • 92 H. Seo, H. Bae, C. Jo, E. Hong, H. Choi, J. S. Hwang, J. Ahn, D. H. Kim, and D. M. Kim "Characterization of Free Electron-Deembedded Subgab Density-of-States in a-IGZO TFTs from the Sub-Bandgap Optical Subthreshold Characteristics" The 20th Korean Conference on Semiconductors, 2013-02 PDF
  • 91 J. Kim, J. Jang, J. Lee, W. Kim, I. Hur, C. Jo, S. Jun, H. Kim, K. M. Lee, D. J. Shin, D. M. Kim, and D. H. Kim "Analytical Current Model for Polymer-based Thin Film Transistors Considering the Field-Dependent Mobility and Nonlinearity in the Linear Region" The 20th Korean Conference on Semiconductors, 2013-02 PDF
  • 90 D. H. Kim, W. Kim, Y. Kim, I. Hur, M. Bae, D. Kong, H. K. Jeong, D. M. Kim "Physical Model and Simulation Platform for High-Level Instability-Aware Design of Amorphous Oxide Semiconductor Thin-Film Transistors" in SID'12 Dig. Tech. Papers, 2012-05 PDF
  • 89 Y.-S. Kim, H.-H. Nahm, and D. H. Kim "Microscopic Mechanism of the Negative Bias and Illumination Stress Instability of Amorphous Oxide TFTs" in SID'12 Dig. Tech. Papers, 2012-05 PDF
  • 88 H. K. Jeong, I. Hur, W. Kim, J. Kim, D. Kong, Y. Kim, M. Bae, S. Choi, D. M. Kim, and D. H. Kim "Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors" in SID'12 Dig. Tech. Papers, 2012-05 PDF
  • 87 J. S. Shin, H. Choi, H. Bae, J. Jang, D. Yun, E. Hong, H. Seo, D. H. Kim, and D. M. Kim "Si/SiGe Vertical Gate DHBT (VerDHBT)-based 1T DRAM Cell For Improved Retention Characteristics With a Large Hysteresis window" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 86 J. S. Shin, H. Bae, E. Hong, J. Jang, D. Yun, H. Seo, H. Choi, D. H. Kim, and D. M. Kim "Separate Extraction Technique of Gate, Source, Drain, and Substrate Resistances in Individual MOSFET Combining I-V and C-V Characteristics" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 85 M. Bae, D. Yun, Y. Kim, D. Kong, H. Jeong, J. Jang, W. Kim, I. Hur, J. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. H. Kim, and D. M. Kim "Differential Ideality Factor Technique and Extraction of Subgap Density-of-States in Amorphous InGaZnO Thin-Film Transistors" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 84 J. Lee, J. H. Lee, H. Jang, M. Uhm, W. H. Lee, S. Hwang, B.-G. Park, I.-Y. Chung, D. M. Kim and D. H. Kim "CMOS-Compatible Inverter-Type Si Nanoribbon Biosensor with High Sensitivity" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 83 J. Kim, J. Jang, M. Bae, W. Kim, I. Hur, Y. Kim, H. Jeong, D. Kong, J. Lee, Y. H. Kim, S. Jun, C. H. Jo, D. M. Kim,and D. H. Kim "Characterization of Density-of-States in olymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 82 I. Hur, H. Bae, M. Bae, Y. Kim, D. Kong, H. Jeong, J. Jang, J. Kim, W. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. M. Kim, and D. H. Kim "Characterization of Intriinsic Field Effect Mobiliity in a-IGZO Thin-Film Transistors Through the De-embedding the Parasitic Source and Drain Resistance Effects" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 81 정현광, 공동식, 김용식, 배민경, 김재형, 김우준, 허인석, 이재욱, 김윤혁, 전성우, 조춘형, 김동명, 김대환 "Amorphous Silicon 박막트랜지스터의 Negative Bias Illumination Stress 하에서의 물리적 Parameter 기반 신뢰성 특성 분석" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 80 김우준, 배민경, 김용식, 김재형, 허인석, 장재만, 정현광, 공동식, 김윤혁 이재욱, 조춘형, 전성우, 김동명, 김대환 "Analytical Model-based SPICE Simulation ofr the Design of Amorphous InGaZnO Thin-Film Transistors-based Circuits" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 79 H. Bae, D. Kong, J. S. Shin, D. Yun, E. Hong, H. Seo, H. Choi, J. Lee, H.-K. Jung, M. Bae, Y. Kim, W. Kim, D. H. Kim, and D. M. Kim "Active Layer Thickness-Dependent Parasitic Resistance Effect in Low Frequency Noise with Subgap Density-of-States in Amorphous Indium-Gallium-Zinc-Oxide TFTs" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 78 J. H. Lee, J. Lee, M-C Sun, W. H. Lee, M Uhm, S. Hwang, I-Y Chung, D. M. Kim, D. H. Kim, and B-G Park "Analysis of hysteresis characteristics of fabricated SiNW biosensor in aqueous environment with reference electrode" Silicon Nanoelectronics Workshop (SNW), 2012 IEEE Digital Object Identifier, 2012- PDF
  • 77 H. Jang, J. Lee, J. H. Lee, H. Seo, M. Uhm, W. H. Lee, D. M. Kim, I.-Y. Chung and D. H. Kim "Analytical of current hysteresis of SiNW in the aqueous solution depending on measurement biases" 2011 11th IEEE NANO, 2011-08 PDF