Prof. Kim`s R.P.

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  • 36 S. W. Kim, J. U. Lee, K. S .Roh, G. C. Kang, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M. "Characterization of Tunnel Oxide Degradation under NAND-type Program/Erase Stresses of SONOS Flash Memory Cell Transistors with 30 nm" The 14th Korean Conference on Semiconductors, Vol. 2, pp. 1023-1024, 2007-02 PDF
  • 35 K.-P Kang, K.-M. Kang, D.-K. Kwak, O-S. Kwon, D.-H. Lee, J.-G. Lee, D. M. Kim, D. J. Kim, H. -J. Song, D. H. Kim, and D.-S. Min "VTH Scaling (DVTS) Circuits using Charge-Recycling Technique for Leakage-Dominant VLSI’s"" International SoC Design Conference, pp. 361-364, 2006-10
  • 34 Y. S. Yu, D. H. Kim, J. D. Lee, and B.-G. Park "Transport Spectroscopy of A Quantum Dot in SOI MOSFET"" The 13th International Symposium on the Physics of Semiconductors and Applications, p. 116, 2006-08
  • 33 J. -U. Lee, K. -H. Baek, C. Olson, D. M. Kim, and A. Gopinath "Simulation of Self-assembled Photonic Crystals with Embedded Waveguide Using FDTD Method" Progress in Electromagnetic Research Symposium(PIERS), Cambridge, Massachusetts, 2006-03 PDF
  • 32 S. W. Kim, J. B. Choi, K. S. Roh, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, J. U. Lee, G. C. Kang, H. T. Kim, D. H. Kim, K. S. Min, D. J. Kim, and D. M. Kim "Sub-Bandgap Photonic Base Current Method for Extracting the Trap Density at Hetero-Interface in Heterojunction Bipolar Transistors" The 13th Korean Conference on Semiconductors, vol. 1, pp. 153-154, 2006-02 PDF
  • 31 J. B. Choi, S. W. Kim, K. S. Roh, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, J. U. Lee, G. C. Kang, H. T. Kim, D. H. Kim, K. S. Min, D. J. Kim, and D. M. Kim "Optical Trap-Assisted Tunneling Current Method for Extracting thr Interface-State Density in the Gate-to-Drain Overlapped Region of MOSFETs" The 13th Korean Conference on Semiconductors, vol. 2, pp. 817-818, 2006-02
  • 30 J. B. Choi, S. W. Kim, K. S. Roh, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, J. U. Lee, G. C. Kang, H. T. Kim, D. H. Kim, K. S. Min, D. J. Kim, and D. M. Kim "Optical Trap-Assisted Tunneling Current Method for Extracting thr Interface-State Density in the Gate-to-Drain Overlapped Region of MOSFETs" The 13th Korean Conference on Semiconductors, vol. 2, pp. 817-818, 2006-02 PDF
  • 29 강경민, 최훈대, 강경필, 곽동곤, 권오삼, 임진혁, 김대환, 송호준, 김대정, 김동명, 민경식 "Low-Latency and High-Bandwidth Multi-Channel SDRAM Controller Using Predictive Reordering Scheme for Multimedia SoC" The 13th Korean Conference on Semiconductors, vol. 2, pp. 925-926, 2006-02
  • 28 강경민, 최훈대, 강경필, 곽동곤, 권오삼, 임진혁, 김대환, 송호준, 김대정, 김동명, 민경식 "FPGA Implementation of Multi-Channel SDRAM Controller" The 13th Korean Conference on Semiconductors, vol. 1, pp. 579-582, 2006-02
  • 27 곽동곤, 최훈대, 강경민, 권오삼, 김대환, 송호준, 김대정, 김동명, 민경식 "Row-By-Row Activated SRAM with Process-VDD-Temperature (PVT) Fluctuation Adaptive Source-Line Biasing Circuit for Low-Leakage Sub-70-nm LSI’s" The 13th Korean Conference on Semiconductors, vol. 1, pp. 199-200, 2006-02
  • 26 강경필, 최훈대, 강경민, 곽동곤, 권오삼, 김대환, 송호준, 김대정, 김동명, 민경식 "Charge-Recycling Dynamic VTH Scaling (DVTS) Circuit for Leakage-Dominant VLSI’s" The 13th Korean Conference on Semiconductors, vol. 1, pp. 173-174, 2006-02
  • 25 최재복, 김세운, 서승환, 김관영, 강구철, 이장욱, 이충현, 노강섭, 이순영, 김해택, 김대환, 민경식, 김대정, 김동명 "Characterization of interface states in the gate-to-drain overlapped region of MOSFETs using GIDL current under sub-bandgap photonic excitation" IT-SOC conference(한국소프트웨어진흥원), pp. 455-457, 2005-11
  • 24 I. C. Nam, H. T. Kim, K. S. Kim, K. H. Kim, J. B. Choi, J. U. Lee, S. W. Kim, G. C. Kang, K. S. Roh, D. J. Kim, K. S. Min, and D. M. Kim "A New Technique for Extracting the Source and Drain Resistances in MOSFETs using Parasitic Bipolar Transistor with Substrate Contact as a Base" The 12th Korean Conference on Semiconductors, vol. 1, pp. 331-332, 2005-02 PDF
  • 23 I. C. Nam, H. T. Kim, T. E. Kim, H. T. Shin, H. S. Park, K. S. Kim, K. H. Kim, J. B. Choi, J. U. Lee, S. H. Jeong, S. W. Kim, D. J. Kim, K. S. Min, and D. M. Kim "Modeling of Substrate Current and Characterization of Trpas in MOSFETs under Sub-Bandgap Photonic Excitation" The 11th Korean Conference on Semiconductors, vol. 2, pp. 231-232, 2004-02 PDF
  • 22 T. E. Kim, H. T. Kim, H. T. Shin, H. S. Park, K. S. Kim, I. C. Nam, K. H. Kim, J. B. Choi, J. U. Lee, S. H. Jeong, S. W. Kim, D. J. Kim, K. S. Min, and D. M. Kim "Extraction of Hot-Carrier Induced Interface States in MOSFETs Using the Sub-Bandgap Photonic Gated-Diode Method" The 11th Korean Conference on Semiconductors, vol. 2, pp. 207-208, 2004-02 PDF
  • 21 H. S. Park, H. T. Kim, T. E. Kim, H. T. Shin, K. S. Kim, I. C. Nam, K. H. Kim, J. B. Choi, J. U. Lee, S. H. Jeong, S. W. Kim, D. J. Kim, K. S. Min, and D. M. Kim "Analysis of Interface Traps in MOSFETs using a Novel Off-State Drain Leakage Characteristics under Sub-Bandgap Photonic Excitation" The 11th Korean Conference on Semiconductors, vol. 2, pp. 235-236, 2004-02 PDF
  • 20 . T. Shin, H. T. Kim, T. E. Kim, H. S. Park, K. S. Kim, I. C. Nam, K. H. Kim, J. B. Choi, J. U. Lee, S. H. Jeong, S. W. Kim, D. J. Kim, K. S. Min, and D. M. Kim "Characterization of Interface States in HBTs using a Novel Photonic Base Current Analysis" The 11th Korean Conference on Semiconductors, vol. 1, pp. 489-490, 2004-02 PDF
  • 19 S. S. Chi, H. T. Kim, M. S. Kim, T. E. Kim, H. T. Shin, K. W. Kang, H. S. Park, D. J. Kim, K. S. Min, and D. M. Kim "Photonic Gated-Diode Method for Extracting the Energy-Dependent and Spatial Distributions of Interface States in MOSFETs" The 10th Korean Conference on Semiconductors, vol. 10, pp. 19-20, 2003-02 PDF
  • 18 M. S. Kim, H. T. Kim, S. S. Chi, T. E. Kim, H. T. Shin, K. W. Kang, H. S. Park, D. J. Kim, K. S. Min, and D. M. Kim "Optical Subthreshold Current Method with MOSFETs for Extracting the Distribution of Interface States in MOS Systmes" The 10th Korean Conference on Semiconductors, vol. 10, pp. 15-16, 2003-02 PDF
  • 17 S. D. Cho, S. J. Song, H. C. Kim, Y. C. Kim, S. K. Kim, S. S. Chi, D. J. Kim, and D. M. Kim "Experimental and Qualitative InvestigatIon of Abnormal Gate Leakage Currents in Pseudomorphic HEMTs" 제8회 한국반도체학술대회 논문집, pp. 523-524,, 2001-02 PDF