Journal papers

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  • 250 S. Choi, Y. Kang, J. Kim, J. Kim, S.-J. Choi, D. M. Kim, H.-Y. Cha, H. Kim, and D. H. Kim "Frequency-dependent C-V Characteristic-based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Heterojunction Field-effect Transistors" JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, vol. 15, no. 5, pp.497-503, 2015-10 PDF
  • 249 J. Lee, S. Choi, S. K. Kim, S.-J. Choi, D. H. Kim, J. Park, and D. M. Kim "Modeling and Characterization of the Abnormal Hump in n-Channel Amorphous-InGaZnO Thin-Film Transistors After High Positive Bias Stress" IEEE Electron Device Letters, vol. 36, no. 10, pp.1047-1049, 2015-10 PDF
  • 248 S. Kim, H.-D. Kim, S.-J. Choi "Numerical study of read scheme in one-selector one-resistor crossbar array" Solid-State Electronics, vol. 114 pp. 80-86, 2015-08 PDF
  • 247 B. Choi, J.-H. Ahn, J. Lee, J. Yoon, J. Lee, M. Jeon, D. M. Kim, D. H. Kim, I. Park, S.-J. Choi "A bottom-gate silicon nanowire field-effect transistor with functionalized palladium nanoparticles for hydrogen gas sensors" Solid-State Electronics, vol. 104 pp. 76-19, 2015-08 PDF
  • 246 H. Choi, J. Lee, H. Bae, S.-J. Choi, D. H. Kim, D. M. Kim, "Bias-Dependent Effective Channel Length for Extraction of Subgap DOS by Capacitance–Voltage Characteristics in Amorphous Semiconductor TFTs" IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 62. no. 8, pp. 2689-2694, 2015-08 PDF
  • 245 J. T. Jang, J. Park, B. D. Ahn, D. M. Kim, S.-J. Choi, H.-S. Kim, D. H. Kim "Study on the Photoresponse of Amorphous In−Ga−Zn−O and Zinc Oxynitride Semiconductor Devices by the Extraction of Sub-Gap- State Distribution and Device Simulation" ACS Appl. Mater. Interfaces, vol. 28. no. 7, pp. 15570-15577, 2015-06 PDF
  • 244 J. Lee,J. Jang, B. Choi, J. Yoon, J.-Y. Kim, Y.-K. Choi, D. M. Kim, D. H. Kim, S.-J. Choi "A Highly Responsive Silicon Nanowire/Amplifier MOSFET Hybrid Biosensor" Scientific Reports, Scientific Reports 5, 2015-07 PDF
  • 243 S. Choi, H. Kim, C. Jo, H.-S. Kim, S.-J. Choi, D. M. Kim, D. H. Kim "A Study on the Degradation of In–Ga–Zn–O Thin-Film Transistors Under Current Stress by Local Variations in Density of States and Trapped Charge Distribution" IEEE ELECTRON DEVICE LETTERS, vol. 36. no. 7, pp. 690-692, 2015-06 PDF
  • 242 K. M. Lee, J. Jang, S.-J. Choi, D. M. Kim,K. R. Kim,D. H. Kim "Extraction of Propagation Delay-Correlated Mobility and Its Verification for Amorphous InGaZnO Thin-Film Transistor-Based Inverters" IEEE Transactions on Electron Devices, vol. 62. no. 5, pp. 1504-1510, 2015-05 PDF
  • 241 J. T. Jang, J. Park, B. D. Ahn, D. M. Kim, S.-J. Choi, H.-S. Kim, D. H. Kim "Effect of direct current sputtering power on the behavior of amorphous indium-galliumzinc- oxide thin-film transistors under negative bias illumination stress" Applied Physics Letters, vol. 106, p. 123505, 2015-04 PDF
  • 240 J. S. Hwang, H. Bae, J. Lee, S.-J. Choi, D. H. Kim, D. M. Kim "Sub-Bandgap Photonic Capacitance-Voltage Method for Characterization of the Interface Traps in Low Temperature Poly-Silicon Thin-Film Transistors" IEEE Electron Device Letters, vol. 36, no. 4, pp.339-341, 2015-04 PDF
  • 239 J. Lee, H. Bae, J. S. Hwang, J. Ahn, J. T. Jang, J. Yoon, S.-J. Choi, D. H. Kim, D. M. Kim "Modeling and Separate Extraction Technique for Gate Bias-Dependent Parasitic Resistances and Overlap Length in MOSFETs" IEEE Transactions on Electron Devices, vol. 62, no. 3, pp. 1063-1067, 2015-03 PDF
  • 238 B. Choi, J. Lee, J. Yoon, J.-H. Ahn, T. J. Park, D. M. Kim, D. H. Kim, S.-J. Choi "TCAD-Based Simulation Method for the Electrolyte–Insulator–Semiconductor Field-Effect Transistor" IEEE Transactions on Electron Devices, vol. 62, no. 3, pp. 1072-1075, 2015-03 PDF
  • 237 S. Jun, H. Bae, H. Kim, J. Lee, S.-J. Choi, D. H. Kim,D. M. Kim "Dual-Sweep Combinational Transconductance Technique for Separate Extraction of Parasitic Resistances in Amorphous Thin-Film Transistors" IEEE Electron Device Letters, vol. 36, no. 2, pp. 144-146, 2015-02 PDF
  • 236 S.-J. Choi, P. Bennett, D. Lee, and J. Bokor "Highly uniform carbon nanotube nanomesh network transistors" Nano research, vol.8, pp 1320-1326, 2014-12 PDF
  • 235 J. Yoon, D. Lee, C. Kim, J. Lee, B. Choi, D. M. Kim, D. H. Kim, M. Lee, Y.-K. Choi, and S.-J. Choi "Accurate extraction of mobility in carbon nanotube network transistors using C-V and IV measurements" Applied Physics Letters, vol. 105, p. 212103, 2014-11 PDF
  • 234 J. Jang, D. G. Kim, D. M. Kim, S.-J. Choi, J.-H. Lim, J.-H. Lee, Y.-S. Kim, B. D. Ahn, and D. H. Kim "Investigation on the negative bias illumination stress-induced instability of amorphous indium-tin-zinc-oxide thin film transistors" Applied Physics Letters, vol. 105, p. 152108, 2014-10 PDF
  • 233 E. K.-H. Yu, S. Jun, D. H. Kim, and J. Kanicki "Density of states of amorphous In-Ga-Zn-O from electrical and optical characterization" J. Appl. Phys., vol. 116. 154505 -1-6, 2014-10 PDF
  • 232 H. Bae, H. Seo, S. Jun, H. Choi, J. Ahn, J. Hwang, J. Lee, S. Oh, J.-U. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim "Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs" IEEE Transactions on Electron Devices, vol. 61. no. 10. pp, 3566 - 3569, 2014-10 PDF
  • 231 J. C. Park, I.-T. Cho, E.-S. Cho, D. H. Kim, C.-Y. Jeong, and H.-I. Kwon "Comparative Study of ZrO2 and HfO2 as a High-k Dielectric for Amorphous InGaZnO Thin Film Transistors" Journal of Nanoelectronics and Optoelectronics, vol. 9, pp. 67-70, 2014-02 PDF