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  • 23 J. Choi, Y. Kang, S. Choi, D. H. Kim, H.-Y. Cha, and H. Kim "Extraction of Interface Trap Density Through Differential Subthreshold Ideality Factor Technique in Normally-off AlGaN/GaN MOSHFETs" 제4회 한국광전자학회(The 4th Conference on Korea Society of Optoelectronics), Nov., 2014-11
  • 22 D. H. Kim, J. Jang, K. M. Lee, S. -J. Choi, and D. M. Kim "Subgap Density-of-States (DOS)-based Simulation for Instability-Aware Design of Oxide TFTs" CAD-TFT 2014, 2014-10 PDF
  • 21 K. M. Lee, J. T. Jang, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim "Negative Bias Illumination Stress Time-Evolution of Subgap States in Amorphous InGaZnO Thin-Film Transistors: Oxygen Vacancy?" IMID 2014 DIGEST, p. 11, 2014-08 PDF
  • 20 D. H. Kim, J. Jang, K. M. Lee, S.-J. Choi, and D. M. Kim " Toward instability-aware design of oxide TFTs(Invited)" IMID 2014 DIGEST, p. 198, 2014-08 PDF
  • 19 J. Jang, S.-J. Choi, D. M. Kim, J.-H. Lim, J.-H. Lee, B. D. Ahn, and D. H. Kim "Negative Bias Illumination Stress-Induced Instability in Amorphous Indium-Tin- Zinc-Oxide TFTs and Its Comparison with Indium-Gallium-Zinc-Oxide TFTs" IMID 2014 DIGEST, p. 199, 2014-08 PDF
  • 18 J. T. Jang, K. M. Lee, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim "The Effect of RF Sputtering Power on Negative Bias Illumination Stress-Induced Instability in Sputtered Amorphous InGaZnO Thin-Film Transistors" IMID 2014 DIGEST, p. 358, 2014-08 PDF
  • 17 S. Choi, J. Jang, H. Kim, D. G. Kim, K. M. Lee, J. H. Kim, D. M. Kim, S.-J. Choi, J. C. Park, and D. H. Kim "VGS/VDS Configuration-Dependence of Positive Bias Stress-Induced Instability in Self-Aligned Top-Gate IZO TFTs" IMID 2014 DIGEST,p. 359, 2014-08 PDF
  • 16 J. Yoon, D. Lee, C. Kim, J. Lee, B. Choi, N. Yoder, J. Humes, D. H. Kim, D. M. Kim, M. Lee, Y.-K. Choi, and S.-J. Choi "Highly separated semiconducting carbon nanotube (99.9%) thin-film transistor using printing technology" IMID 2014 DIGEST, p. 568, 2014-08 PDF
  • 15 J.-W. Park, H. Kim, D. H. Kim, and M. Lee "Study of the improvements in the electrical performance of solution-processed metal oxide thin-film transistors using self-assembled monolayers" SPIE Optics & Photonics 2014, 2014-08 PDF
  • 14 Y. Kang, J.-G. Lee, S. Choi, D. H. Kim, H.-Y. Cha, and H. Kim "Extraction of Interface Trap Density Through Differential Subthreshold Ideality Factor Technique in Normally-off AlGaN/GaN MOSHFETs" Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD), Poster, 2014-07 PDF
  • 13 J. Lee, J. Jang, H. Kim, C. Jo, S. Jun, K. M. Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "The Effect of Passivation on the Positive Bias Stress-Induced Instability of Polymer Thin-Film Transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 296, 2014-02 PDF
  • 12 C. Jo, H. Kim, S. Jun, D. J. Shin, K. M. Lee, J. Jang, J. Lee, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "Study on Physical Mechanism on the Positive Bias Stress-Induced Degradation ofAmorphous InGaZnO Thin-Film Transistors with Density-of-States BasedCharacterization" The 21st Korean Conference on Semiconductors(KCS 2014), p. 96, 2014-02 PDF
  • 11 K. M. Lee, S. Jun, H. Kim, C. Jo, J. Jang, J. Lee, D. J. Shin, J. T. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "Oxygen vacancy-dependent density-of-states and its effect on the negative bias illumination stress-induced degradation in amorphous oxide semiconductor thin-film transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 54, 2014-02 PDF
  • 10 J. T. Jang, K. M. Lee, H. Kim, J. Jang, D. J. Shin, S. Choi, J. Lee, C. Jo, S. Jun, S.-J. Choi, D. M. Kim, and D. H. Kim "Effect of the RF power in sputter system on performance and photoelectric degradation of amorphous indium-gallium-zinc-oxide thin-film transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 56, 2014-02 PDF
  • 9 D. Shin, S. Jun, K. M. Lee, H. Kim, C. Jo, J. Jang, J. Lee, S.-J. Choi, D. M. Kim, and D. H. Kim "Effect of ultra-thin active layer thickness on the subthreshold slope and bipolar bias stress-induced degradation in amorphous InGaZnO thin-film transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 52, 2014-02 PDF
  • 8 H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. Min Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "Effect of gate/drain voltage configuration on electrical degradation of the bottom-gate In-Ga-Zn-O thin-film transistors driving AMOLED displays" The 21st Korean Conference on Semiconductors(KCS 2014), p. 111, 2014-02 PDF
  • 7 S. Choi, J. Jang, H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. M. Kim, D. J. Shin, S.-J. Choi, D. M. Kim, and D. H. Kim "Constant current stress-induced instability of the top-gate IZO TFTs for AMOLED displays" The 21st Korean Conference on Semiconductors(KCS 2014), p. 107, 2014-02 PDF
  • 6 Y. H. Kim, D. G. Kim, J.-D. Kim, S.-J. Choi, D. M. Kim, T.-S. Yoon, and D. H. Kim "Characterization of γ-Fe2O3 memristors via physics-based empirical I-V model" The 21st Korean Conference on Semiconductors(KCS 2014), p. 372, 2014-02 PDF
  • 5 H. Choi, H. Bae, J. Ahn, J. S. Hwang, J. Lee, S.-J. Choi, D. H. Kim, and D. M. Kim "Capacitance-Voltage Technique for Extraction of Intrinsic Subgap DOS in AOS TFTs with Bias-Dependent Channel Conduction Factor Model" The 21st Korean Conference on Semiconductors(KCS 2014). p. 297, 2014-02 PDF
  • 4 B. Choi, J. Lee, D. M. Kim, D. H. Kim, and S.-J. Choi "An accurate and efficient simulation technique for FET-type biosensors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 443, 2014-02 PDF