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  • 168 H. Kang, J. T. Jang, S.-J. Choi, D. M. Kim, D. H. Kim "Investigation of PBS-induced instability under various stress condition in a-IGZO TFT" 대한전자공학회 하계학술대회, 2015-06 PDF
  • 167 J. Kim, J. Kim, S. Choi, D. M. Kim, S.-J. Choi, D. H. Kim "The Analysis of Instability for Oxygen Flow Rate in Positive Bias Stress on High Gate Voltage or High Drain Voltage in a-IGZO Bottom-gate TFT" 대한전자공학회 하계학술대회, 2015-06 PDF
  • 166 S. Choi, Y. Kang, J. Kim, S.-J. Choi, D. M. Kim, H.-Y. Cha, H. Kim, D. H. Kim "Frequency-dependent C-V Based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Field-effect Transistors" ICEIC 2015, 2015-02 PDF
  • 165 J. T. Jang, H. Kang, J.H. Kim, S.-J. Choi, D. M. Kim, D. H. Kim "Analysis on the low VGS/high VDS stress-induced instability in amorphous indium-gallium-zinc-oxide thin-film transistors" ICEIC 2015, 2015-02 PDF
  • 164 H. Kang, J. T. Jang, J. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim "Comparative analysis on positive bias stress-induced instability under HVGS and HVDS in amorphous InGaZnO thin-film transistors" The 22nd Korean Conference on Semiconductors(KCS 2015), p. 337, 2015-02 PDF
  • 163 S. Choi, Y. Kang, J. Kim, J. Kim, S.-J. Choi, D. M. Kim, H.-Y. Cha, H. Kim., and D. H. Kim "Extraction of Interface Trap Density by using frequency dispersion of C-V in Normally-off Gate-recessed AlGaN/GaN HFETs" The 22nd Korean Conference on Semiconductors(KCS 2015), p. 28, 2015-02 PDF
  • 162 J. Lee, S. Choi, J. Ahn, J. S. Hwang, S. K. Kim, S.-J. Choi, D. H. Kim and D. M. Kim "Hump characteristics generated by bias stress in a-IGZO TFTs" The 22nd Korean Conference on Semiconductors(KCS 2015), p. 275, 2015-02 PDF
  • 161 J. Kim, S. Choi, J. Jang, J. T. Jang, J. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim "Analysis of instability mechanism under simultaneous positive gate and drain bias stress in self-aligned top-gate amorphous indium-zinc-oxide thin-film transistors" The 22nd Korean Conference on Semiconductors(KCS 2015), p. 334, 2015-02 PDF
  • 160 J. Lee, B. Choi, J. Yoon, M. Jeon, J. Jang, D. M. Kim, D. H. Kim, and S.-J. Choi "Analysis of structural dependences on the electrical performance of vertical organic field-effect transistor (VOFET)" The 22nd Korean Conference on Semiconductors(KCS 2015), p. 67, 2015-02 PDF
  • 159 H. M. Choi, J. Park, D. J. Shin, B. Choi, S. Kim, H. Mo, D. M. Kim, S.-J. Choi, D. H. Kim "Biosensing comparison between dry and wet environment in silicon nanowire transistor" The 22nd Korean Conference on Semiconductors(KCS 2015), 2015-02 PDF
  • 158 J. Choi, Y. Kang, S. Choi, D. H. Kim, H.-Y. Cha, and H. Kim "Extraction of Interface Trap Density Through Differential Subthreshold Ideality Factor Technique in Normally-off AlGaN/GaN MOSHFETs" 제4회 한국광전자학회(The 4th Conference on Korea Society of Optoelectronics), Nov., 2014-11
  • 157 D. H. Kim, J. Jang, K. M. Lee, S. -J. Choi, and D. M. Kim "Subgap Density-of-States (DOS)-based Simulation for Instability-Aware Design of Oxide TFTs" CAD-TFT 2014, 2014-10 PDF
  • 156 K. M. Lee, J. T. Jang, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim "Negative Bias Illumination Stress Time-Evolution of Subgap States in Amorphous InGaZnO Thin-Film Transistors: Oxygen Vacancy?" IMID 2014 DIGEST, p. 11, 2014-08 PDF
  • 155 D. H. Kim, J. Jang, K. M. Lee, S.-J. Choi, and D. M. Kim " Toward instability-aware design of oxide TFTs(Invited)" IMID 2014 DIGEST, p. 198, 2014-08 PDF
  • 154 J. Jang, S.-J. Choi, D. M. Kim, J.-H. Lim, J.-H. Lee, B. D. Ahn, and D. H. Kim "Negative Bias Illumination Stress-Induced Instability in Amorphous Indium-Tin- Zinc-Oxide TFTs and Its Comparison with Indium-Gallium-Zinc-Oxide TFTs" IMID 2014 DIGEST, p. 199, 2014-08 PDF
  • 153 J. T. Jang, K. M. Lee, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim "The Effect of RF Sputtering Power on Negative Bias Illumination Stress-Induced Instability in Sputtered Amorphous InGaZnO Thin-Film Transistors" IMID 2014 DIGEST, p. 358, 2014-08 PDF
  • 152 S. Choi, J. Jang, H. Kim, D. G. Kim, K. M. Lee, J. H. Kim, D. M. Kim, S.-J. Choi, J. C. Park, and D. H. Kim "VGS/VDS Configuration-Dependence of Positive Bias Stress-Induced Instability in Self-Aligned Top-Gate IZO TFTs" IMID 2014 DIGEST,p. 359, 2014-08 PDF
  • 151 J. Yoon, D. Lee, C. Kim, J. Lee, B. Choi, N. Yoder, J. Humes, D. H. Kim, D. M. Kim, M. Lee, Y.-K. Choi, and S.-J. Choi "Highly separated semiconducting carbon nanotube (99.9%) thin-film transistor using printing technology" IMID 2014 DIGEST, p. 568, 2014-08 PDF
  • 150 J.-W. Park, H. Kim, D. H. Kim, and M. Lee "Study of the improvements in the electrical performance of solution-processed metal oxide thin-film transistors using self-assembled monolayers" SPIE Optics & Photonics 2014, 2014-08 PDF
  • 149 Y. Kang, J.-G. Lee, S. Choi, D. H. Kim, H.-Y. Cha, and H. Kim "Extraction of Interface Trap Density Through Differential Subthreshold Ideality Factor Technique in Normally-off AlGaN/GaN MOSHFETs" Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD), Poster, 2014-07 PDF