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  • 154 J. Jang, S.-J. Choi, D. M. Kim, J.-H. Lim, J.-H. Lee, B. D. Ahn, and D. H. Kim "Negative Bias Illumination Stress-Induced Instability in Amorphous Indium-Tin- Zinc-Oxide TFTs and Its Comparison with Indium-Gallium-Zinc-Oxide TFTs" IMID 2014 DIGEST, p. 199, 2014-08 PDF
  • 153 J. T. Jang, K. M. Lee, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim "The Effect of RF Sputtering Power on Negative Bias Illumination Stress-Induced Instability in Sputtered Amorphous InGaZnO Thin-Film Transistors" IMID 2014 DIGEST, p. 358, 2014-08 PDF
  • 152 S. Choi, J. Jang, H. Kim, D. G. Kim, K. M. Lee, J. H. Kim, D. M. Kim, S.-J. Choi, J. C. Park, and D. H. Kim "VGS/VDS Configuration-Dependence of Positive Bias Stress-Induced Instability in Self-Aligned Top-Gate IZO TFTs" IMID 2014 DIGEST,p. 359, 2014-08 PDF
  • 151 J. Yoon, D. Lee, C. Kim, J. Lee, B. Choi, N. Yoder, J. Humes, D. H. Kim, D. M. Kim, M. Lee, Y.-K. Choi, and S.-J. Choi "Highly separated semiconducting carbon nanotube (99.9%) thin-film transistor using printing technology" IMID 2014 DIGEST, p. 568, 2014-08 PDF
  • 150 J.-W. Park, H. Kim, D. H. Kim, and M. Lee "Study of the improvements in the electrical performance of solution-processed metal oxide thin-film transistors using self-assembled monolayers" SPIE Optics & Photonics 2014, 2014-08 PDF
  • 149 Y. Kang, J.-G. Lee, S. Choi, D. H. Kim, H.-Y. Cha, and H. Kim "Extraction of Interface Trap Density Through Differential Subthreshold Ideality Factor Technique in Normally-off AlGaN/GaN MOSHFETs" Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD), Poster, 2014-07 PDF
  • 148 J. Lee, J. Jang, H. Kim, C. Jo, S. Jun, K. M. Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "The Effect of Passivation on the Positive Bias Stress-Induced Instability of Polymer Thin-Film Transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 296, 2014-02 PDF
  • 147 C. Jo, H. Kim, S. Jun, D. J. Shin, K. M. Lee, J. Jang, J. Lee, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "Study on Physical Mechanism on the Positive Bias Stress-Induced Degradation ofAmorphous InGaZnO Thin-Film Transistors with Density-of-States BasedCharacterization" The 21st Korean Conference on Semiconductors(KCS 2014), p. 96, 2014-02 PDF
  • 146 K. M. Lee, S. Jun, H. Kim, C. Jo, J. Jang, J. Lee, D. J. Shin, J. T. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "Oxygen vacancy-dependent density-of-states and its effect on the negative bias illumination stress-induced degradation in amorphous oxide semiconductor thin-film transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 54, 2014-02 PDF
  • 145 J. T. Jang, K. M. Lee, H. Kim, J. Jang, D. J. Shin, S. Choi, J. Lee, C. Jo, S. Jun, S.-J. Choi, D. M. Kim, and D. H. Kim "Effect of the RF power in sputter system on performance and photoelectric degradation of amorphous indium-gallium-zinc-oxide thin-film transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 56, 2014-02 PDF
  • 144 D. Shin, S. Jun, K. M. Lee, H. Kim, C. Jo, J. Jang, J. Lee, S.-J. Choi, D. M. Kim, and D. H. Kim "Effect of ultra-thin active layer thickness on the subthreshold slope and bipolar bias stress-induced degradation in amorphous InGaZnO thin-film transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 52, 2014-02 PDF
  • 143 H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. Min Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "Effect of gate/drain voltage configuration on electrical degradation of the bottom-gate In-Ga-Zn-O thin-film transistors driving AMOLED displays" The 21st Korean Conference on Semiconductors(KCS 2014), p. 111, 2014-02 PDF
  • 142 S. Choi, J. Jang, H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. M. Kim, D. J. Shin, S.-J. Choi, D. M. Kim, and D. H. Kim "Constant current stress-induced instability of the top-gate IZO TFTs for AMOLED displays" The 21st Korean Conference on Semiconductors(KCS 2014), p. 107, 2014-02 PDF
  • 141 Y. H. Kim, D. G. Kim, J.-D. Kim, S.-J. Choi, D. M. Kim, T.-S. Yoon, and D. H. Kim "Characterization of γ-Fe2O3 memristors via physics-based empirical I-V model" The 21st Korean Conference on Semiconductors(KCS 2014), p. 372, 2014-02 PDF
  • 140 H. Choi, H. Bae, J. Ahn, J. S. Hwang, J. Lee, S.-J. Choi, D. H. Kim, and D. M. Kim "Capacitance-Voltage Technique for Extraction of Intrinsic Subgap DOS in AOS TFTs with Bias-Dependent Channel Conduction Factor Model" The 21st Korean Conference on Semiconductors(KCS 2014). p. 297, 2014-02 PDF
  • 139 B. Choi, J. Lee, D. M. Kim, D. H. Kim, and S.-J. Choi "An accurate and efficient simulation technique for FET-type biosensors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 443, 2014-02 PDF
  • 138 J. S. Hwang, H. Bae, H. Choi, J. Ahn, J. Lee, S.-J Choi, D. H. Kim, and D. M. Kim "A Dual Sweep Transfer Curve Technique for Separate Extraction of Source and Drain Resistances in Advanced FETs without Substrate Contacts" The 21st Korean Conference on Semiconductors(KCS 2014), p. 71, 2014-02 PDF
  • 137 J. Ahn, H. Bae, H. Choi, J. S. Hwang, J. Lee, S.-J. Choi, D. H.Kim, and D. M. Kim "A Novel Characterization Technique for Location of Laterally Distributed Grain Boundary in Polycrystalline Silicon Thin-Film Transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 295, 2014-02 PDF
  • 136 D. H. Kim, K.-M. Lee, and J. T. Jang "Material Effects on Photoelectric Instability of Amorphous Oxide Thin-Film Transistors" ICEIC 2014, Kota Kinabalu, Malaysia, pp. 179-180, 2014-01 PDF
  • 135 I. Nam, D. Kim, C.-W. Baik, D. M. Kim, S. Hwang, and S. Kim "Direct Determination of Parasitic Gate Capacitance with Compensated Displacement Current in Silicon Nanowire FETs" ISANN 2013, 2013-12 PDF