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  • 74 Y. W. Jeon, S. Kim, S. Lee, D. M. Kim, D. H. Kim, S. W. Kim, S. I. Kim, J. Park, U-I. Chung, C.-J. Kim, J.-H. Lee, B. D. Ahn, S. Y. Park, J.-H. Park, J. H. Kim and J. Park "Subgap Density of States-Based Amorphous Oxide Thin Film Transistor Simulator (DAOTS) for Process Optimization and Circuit Design" in SID'10 Dig. Tech. Papers, pp. 1385-1388, 2010-05 PDF
  • 73 D.‐I. Moon, S.‐J. Choi, J.‐W. Han, and Y.‐K. Choi "A Study of a BJT based capacitorless 1T‐DRAM with Consideration of Geometrical Dependence" Proceedings of the 17th Korean Conference on Semiconductors, pp. 7‐8, Daegu, 2010-02 PDF
  • 72 M. Jang, M. Jun, Y.‐K. Choi, and S.‐J. Choi "Metal source/drain technology for nanoscale MOSFET & high speed flash applications" Semicon Korea 2010, 2010-02 PDF
  • 71 Y. W. Jeon, S. Lee, S. Kim, H. Jung, D. Kong, Y. Kim, M. Bae, D. M. Kim, and D. H. Kim "A physical parameter based on DC I-V numerical model of amorphous InGaZnO Thin Film Transistors" The 17th Korean Conference on Semiconductors, 2010-02 PDF
  • 70 S. C. Baek, S. W. Park, H. Y. Bae, J. M. Jang, J. E. Lee, S. Y. Lee, H. R. Jang, H. J. Kim, D. Y. Yun, J. S. Shin, D. H. Kim, and D. M. Kim "Accurate Extraction of Gate Capacitances in Leaky MOS Systems using Modified 3-element circuit Model Combining the Multi-Frequency Capacitance-Voltage Method" The 17th Korean Conference on Semiconductors, 2010-02 PDF
  • 69 D. Kong, S. Lee, Y. Jeon, S. Kim, Y. Kim, H. Jung, M. Bae, D. M. Kim and D. H. Kim "Electrical stress-induced instability of amorphous InGaZnO thin-film transistors under bipolar AC stress" The 17th Korean Conference on Semiconductors, 2010-02 PDF
  • 68 S. Lee, Y. W. Jeon, J. Jang, J. S. Sin, H. J. Kim, H. Y. Bae, D. H. Yun, D. H. Kim, and D. M. Kim "A Novel Self-Aligned 4-bit SONOS-Type Non-Volatile Memory Cell with T-Gate and I-Shaped FinFET Structure and Low Current Sense Amplifier" The 17th Korean Conference on Semiconductors, 2010- PDF
  • 67 S. Lee, Y. Jeon, S. Kim, M.-K. Bae, D. Kong, Y. Kim, H. K. Jung, D. M. Kim, and D. H. Kim "Characterization of the C-V Response of Amorphous Indium Gallium Zinc Oxide TFTs" 17th Korean Conference on Semiconductors, 2010- PDF
  • 66 S. Lee, S. Park, S. Kim, Y. Jeon, D. Kong , M.-K. Bae, H. K. Jung, Y. S. Kim, D. M. Kim, and D. H. Kim "Subgap Density-of-States Extraction of Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors by Using Multiple Frequency C-V Characteristics" The 17th Korean Conference on Semiconductors, 2010- PDF
  • 65 Y.‐K. Choi, M. Jang, and S.‐J. Choi "High speed Flash Memory by a Dopant‐Segregated Schottky‐Barrier MOSFET" 2009 Bulletin of the Korean Physical Society, pp. 191, 2009-10 PDF
  • 64 S.‐J. Choi, J.‐W. Han, S. Kim, D.‐I. Moon, M. Jang, J. S. Kim, K. H. Kim, G. S. Lee, J. S. Oh, M. H. Song, Y. C. Park, J. W. Kim, and Y.‐K. Choi "Performance Breakthrough in NOR Flash Memory with Dopant‐Segregated Schottky‐Barrier (DSSB) SONOS Devices" Symposium on VLSI Technology Digest of Technical Papers (VLSI), pp. 222‐223, 2009-06 PDF
  • 63 S.‐J. Choi, S.‐W. Ryu, J.‐W. Han, S. Kim, and Y.‐K. Choi "A Novel Capacitorless DRAM Operated by Gate‐Induced Drain‐Leakage (GIDL) for Improved Sensing Window and Low Power Operation" Proceedings of the 16th Korean Conference on Semiconductors, pp. 62-63, 2009-02 PDF
  • 62 J.‐W. Han, S.‐W. Ryu, S. Kim, C.‐J. Kim, J.‐H. Ahn, S.‐J. Choi, K. J. Choi, B. J. Cho, J. S. Kim, K. H. Kim, G. S. Lee, J. S. Oh, M. H. Song, Y. C. Park, J. W. Kim, and Y.‐K. Choi "Gate‐All‐Around Silicon Nanowire MOSFETs on Bulk Substrate" Proceedings of the 16th Korean Conference on Semiconductors, 2009-02 PDF
  • 61 S. Park , S.-C. Baek, Y. J. Seo, H.-M. An, T. G. Kim, D. M. Kim, and D. H. Kim "Comparative Study on Dynamic Bias Temperature Instability-like Behavior with Program/Erase Cycles in MANOS and SONOS Memories" The 16th Korean Conference on Semiconductors, 2009- PDF
  • 60 S. R. Park, C. Choi, D. M. Kim, and D. H. Kim "Comparative Study on Program Speed and Retention Characteristics in Advanced Nitride-Based Charge Trap Flash (CTF) Memories in Perspective of Vertical Location of Charge Traps" The 16th Korean Conference on Semiconductors, 2009- PDF
  • 59 J. Lee, C. Choi, S. Park, J. Jang, I.-Y. Chung, C.-J. Kim, D. M. Kim, and D. H. Kim "Comparative Study on Ultra-Energy-Efficient Full Adders Based on Single-Electron Transistors" 16th Korean Conference on Semiconductors, 2009- PDF
  • 58 C. Choi, S. R. Park, J. Jang, J.-S. Lee, K.-S. Min, J. G. Lee, D. M. Kim, and D. H. Kim "Comparative Study on Program/Erase Speed, Retention, and Process Margin for Manufacturability of High Performance Metal Nanocrystal Memories" The 16th Korean Conference on Semiconductors, 2009- PDF
  • 57 J.-H. Park, K. Jeon, S. Lee, Y. W. Jeon, C. Kim, I. Song, J. Park, S. Kim, S. Kim, Y. Park, D. M. Kim, and D. H. Kim "Density of States-Based Model of Amorphous GaInZnO Thin Film Transistors by Using Optical Charge Pumping Technique" The 16th Korean Conference on Semiconductors, 2009- PDF
  • 56 T. Y. Kim, S. R. Park, S.-C. Baek, Y. W. Jeon, Y. J. Seo, H.-M. An, T. G. Kim, D. H. Kim, and D. M. Kim "Extraction of Trap Energy Distribution in Nitride-based MANOS Charge Trap Flash Memory by Combining the Iteration Method with Optical C-V Measurement" The 16th Korean Conference on Semiconductors, 2009- PDF
  • 55 J. C. Park, S. W. Kim, S. I. Kim, H. Yin, J. H. Hur, S. H. Jeon, S. H. Park, I. H. Song, Y. S. Park, U. I. Chung, M. K. Ryu, S. Lee, S. Kim, Y. Jeon, D. M. Kim, D. H. Kim, K.-W. Kwon and C. J. Kim "High performance amorphous oxide thin film transistors with self-aligned top-gate structure" IEDM Tech. Dig., pp. 191-194, 2009- PDF