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◈ date : 2019/02/28
◈ time : 1:30 ~ 4:00 pm
◈ place : 7th building 2nd floor no. 502
◈ presenter : juntee Yu, Donguk Kim, Jungi Min
◈ book : MOSFET MODELING FOR VLSI SIMULATION Theory and Practice (Narain Arora)
Chapter 8. Modeling Hot-Carrier Effects
발표자 : juntee Yu
Ch. 8. 1. Substrate Current Model
발표자 : Jungi Min
Ch. 8. 2. Gate Current Model
Ch. 8. 3. Correlation of Gate and Substrate Current
발표자 : Donguk Kim
Ch. 8. 4. Mechanism of MOSFET
Ch. 8. 5. Measure of Degradation-Device Lifetime
Ch. 8. 6. Impact of Degradation on Circuit Performance
Ch. 8. 7. Temperature Dependence of Device Degradation
Thanks you.
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