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◈ time : P.M. 15:00
◈ place : 7th building 5th floor no. 502
◈ presenter : Woo Sik Choi
◈ papers
Title : Control of the Boundary between the Gradual and abrupt modulation of resistance in the schottky barrier tunneling-modulated amorphous indum-gallium-zinc-oxide memristors for neuromorphic computing
◈ papers information :
Jun Tae Jang, Geumho Ahn, Sung-Jin Choi, Dong Myong Kim and Dae Hwan Kim , “ Control of the Boundary between the Gradual and abrupt modulation of resistance in the schottky barrier tunneling-modulated amorphous indum-gallium-zinc-oxide memristors for neuromorphic computing ,” Electronics., vol. 8, no. 10, pp. 1087–1098, Sep. 2013
◈ presenter : Youngjin Seo
◈ papers
Title : The electron trap parameter extraction-based investigation of the
relationship between charge trapping and activation energy in IGZO TFTs
under positive bias temperature stress
◈ papers information :
Jihyun Rhee, Sungju Choi, Hara Kang, Jae-Young Kim, Daehyun Ko, Geumho Ahn, Haesun Jung, Sung-Jin Choi, Dong Myong Kim, Dae Hwan Kim, “The electron trap parameter extraction-based investigation of the relationship between charge trapping and activation energy in IGZO TFTs under positive bias temperature stress,” Solid State Electronics., vol. 140, pp. 90–95, Feb. 2018
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