◈ date : 2013/11/05

◈ time : 7 p.m.

◈ place : 7th building 5nd floor no. 502

◈ presenter : Jaeman Jang, Hyeongjung Kim

◈ papers :

-Unusual instability mode of transparent all oxide thin film transistor under dynamic bias condition

-Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors