◈ date : 2015/07/06
◈ time :  19:00 ~21:00
◈ place : 7th building 5nd floor no. 502
◈ presenter : Juhee Lee, Yongwoo Lee
◈ book :
-SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION 
-DIETER K.SCHRODER
2. Carrier and Doping Density

Yongwoo Lee 
2.1 Introduction
2.2 Capacitance-Voltage
2.3 Current-Voltage

Juhee Lee  
2.4 Measurement Errors and Precautions
2.5 Hall Effect
2.6 Optical Techniques
2.7 Secondary Ion Mass Spectrometry
2.8 Rutherford Backscattering
2.9 Lateral Profiling
2.10 Strengths and Weaknesses