11J. Lee, S. Jun, J. Jang, H. Bae, H. Kim, J. W. Chung, S.-J. Choi, D. H. Kim, J. Lee, and D. M. Kim"Fully Transfer Characteristic-based Technique for Surface Potential and Subgap Density-of-States in p-Channel Polymer-based TFTs"IEEE Electron Device Letters, vol. 34, no. 12, pp. 1521-1523, 2013-11
10M. Bae, K. M. Lee, E.-S. Cho, H.-I. Kwon, D. M. Kim, and D. H. Kim"Analytical Current and Capacitance Models for Amorphous Indium-Gallium-Zinc-Oxide"IEEE Trans. Electron Devices, vol. 60, no. 10, pp. 3465-3473, 2013-10
9I. Nam, B. Hong, M. Kim, J. Shin, I. Song, D. M. Kim, S. Hwang, and S. Kim"Capacitive coupling model and extraction of the molecular interface states in porphyrin-silicon nanowire hybrid field-effect transistor"Applied Physics Letters, vol. 103, p. 233104, 2013-12
8H. Bae, H. Choi, S. Jun, C. Jo, Y. H. Kim, J. S. Hwang, J. Ahn, S. Oh, J.-U. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim"Single Scan Monochromatic Photonic Capacitance -Voltage Technique for Extraction of Subgap DOS over the Bandgap in Amorphous Semiconductor TFTs"IEEE Electron Device Letters, vol. 34, no. 12, pp. 1524-1526, 2013-09
7J. Kim, J. Jang, M. Bae, J. Lee, W. Kim, I. Hur, H. K. Jeong, D. M. Kim, and D. H. Kim"Characterization of Density-of-States in Polymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator"Journal of Semiconductor Technology and Science, vol. 13, no. 1, pp. 43-47, 2013-02
6S.H. Kim, D.-I. Moon, W. Lu, D. H. Kim, D. M. Kim, Y.-K. Choi, and S.‐J. Choi"Latch-up based bidirectional npn selector for bipolar resistance-change memory"Applied Physics Letters, vol. 103, issue. 3, p. 033505, 2013-07
5S. Jun, C. Jo, H. Bae, H. Choi, D. H. Kim, and D. M. Kim"Unified Subthreshold Coupling Factor Technique for Surface Potential and Subgap Density-of-States in Amorphous Thin Film Transistors"IEEE Electron Device Letters, vol. 34, no. 5, pp. 641-643, 2013-05
4C. Jo, S. Jun, W. Kim, I. Hur, H. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim"Characterization of density-of-states and parasitic resistance in a-InGaZnO thin-film transistors after negative bias stress"Appl. Phys. Letters, vol. 102, issue. 5, p. 143502, 2013-04
3I. Hur, H. Bae, W. Kim, J. Kim, H. K. Jeong, C. Jo, S. Jun, J. Lee, Y. H. Kim, D. H. Kim, and D. M. Kim"Characterization of Intrinsic Field-Effect Mobility in TFTs by De-Embedding the Effect of Parasitic Source and Drain Resistances"IEEE Electron Device Letters, vol. 34, no. 2, pp. 250-252, 2013-02
2J. Lee, J.-M. Lee, J. H. Lee, M. Uhm, W. H. Lee, S. Hwang, I.-Y. Chung, B.-G. Park, D. M. Kim, Y.-J. Jeong,and D. H. Kim"SiNW-CMOS Hybrid Common-Source Amplifier as a Voltage-Readout Hydrogen Ion Sensor"IEEE Electron Device Letters, vol. 34, no. 1, pp. 135-137, 2013-01
1H. Bae, H. Choi, S. Oh, D. H. Kim, J. Bae, J. Kim, Y. H. Kim, and D. M. Kim"Extraction Technique for Intrinsic Subgap DOS in a-IGZO TFTs by De-Embedding the Parasitic Capacitance Through the Photonic C-V Measurement"IEEE Electron Device Letters, vol. 34, no. 1, pp. 57-59, 2013-01