Prof. Kim`s R.P.

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  • 116 D. H. Kim , S. Park, Y. J. Seo, T. G. Kim , D. M. Kim, and I. H. Cho "Comparative investigation of endurance and bias temperature instability characteristics in metal-Al 2 O 3 -nitride-oxide-semiconductor (MANOS) and semiconductor-oxide-nitride-oxide-semiconductor (SONO" Journal of Semiconductor Technology and Science, vol. 12, No. 4, pp.449-457, 2012-12 PDF
  • 115 H. Jang , J. Lee , J. H. Lee , S. Seo , B.-G. Park , D. M. Kim , D. H. Kim , and I.-Y. Chung "Analysis of hysteresis characteristics of silicon nanowire biosensors in aqueous environment" Appl. Phys., vol. 99, Issue 25, p. 252103, 2011-11 PDF
  • 114 S. Lee, Y. W. Jeon, S. Kim, D. Kong, D. H. Kim , and D. M. Kim "Comparative Study of Quasi-Static and Normal Capacitance-Voltage Characteristics in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors" Solid-State Electronics, vol. 56, pp. 95-99, 2010-11 PDF
  • 113 S.H. Kim, D.-I. Moon, W. Lu, D. H. Kim, D. M. Kim, Y.-K. Choi, and S.‐J. Choi "Latch-up based bidirectional npn selector for bipolar resistance-change memory" Applied Physics Letters, vol. 103, issue. 3, p. 033505, 2013-07 PDF
  • 112 S. Jun, C. Jo, H. Bae, H. Choi, D. H. Kim, and D. M. Kim "Unified Subthreshold Coupling Factor Technique for Surface Potential and Subgap Density-of-States in Amorphous Thin Film Transistors" IEEE Electron Device Letters, vol. 34, no. 5, pp. 641-643, 2013-05 PDF
  • 111 C. Jo, S. Jun, W. Kim, I. Hur, H. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim "Characterization of density-of-states and parasitic resistance in a-InGaZnO thin-film transistors after negative bias stress" Appl. Phys. Letters, vol. 102, issue. 5, p. 143502, 2013-04 PDF
  • 110 I. Hur, H. Bae, W. Kim, J. Kim, H. K. Jeong, C. Jo, S. Jun, J. Lee, Y. H. Kim, D. H. Kim, and D. M. Kim "Characterization of Intrinsic Field-Effect Mobility in TFTs by De-Embedding the Effect of Parasitic Source and Drain Resistances" IEEE Electron Device Letters, vol. 34, no. 2, pp. 250-252, 2013-02 PDF
  • 109 J. Lee, J.-M. Lee, J. H. Lee, M. Uhm, W. H. Lee, S. Hwang, I.-Y. Chung, B.-G. Park, D. M. Kim, Y. -J. Jeong, and D. H. Kim "SiNW-CMOS Hybrid Common-Source Amplifier as a Voltage-Readout Hydrogen Ion Sensor" IEEE Electron Device Letters, vol. 34, no. 1, pp. 135-137, 2013-01 PDF
  • 108 H. Bae, H. Choi, S. Oh, D. H. Kim, J. Bae, J. Kim, Y. H. Kim, and D. M. Kim "Extraction Technique for Intrinsic Subgap DOS in a-IGZO TFTs by De-Embedding the Parasitic Capacitance Through the Photonic C-V Measurement" IEEE Electron Device Letters, vol. 34, no. 1, pp. 57-59, 2013-01 PDF
  • 107 S. C. Baek, H. Bae, D. H. Kim, and D. M. Kim "Avalanche Hot Source Method for Separated Extraction of Parasitic Source and Drain Resistance in Single Metal-Oxide-Semiconductor Field Effect Transistors" Journal of Semiconductor Technology and Science, vol. 12, no. 1, pp. 46-52, 2012-03 PDF
  • 106 H.-S Kim, J. S. Park, H.-K. Jeong, K. S. Son, T. S. Kim, J.-B. Seon, E. Lee, J. G. Chung, D. H. Kim, M. Ryu, and S. Y. Lee "Density of States-Based Design of Metal Oxide Thin-Film Transistors for High Mobility and Superior Photostability" ACS Appl. Mater. Interfaces, vol. 4, no. 10, pp. 5416-5421, 2012-09 PDF
  • 105 J. Lee, J. -M. Lee, J. H. Lee, W. H. Lee, M. Uhum, B. -G. Park, D. M. Kim, Y. -J. Jeong, and D. H. Kim "Complementary Silicon Nanowire Hydrogen Ion Sensor With High Sensitivity and Voltage Output" IEEE Electron Device Letters, vol. 33, no. 12, pp. 1768-1770, 2012-12 PDF
  • 104 Y. Kim, S. Kim, W. Kim, M. Bae, H. K. Jeong, D. Kong, S. Choi, D. M. Kim and D. H. Kim "Amorphous InGaZnO Thin-Film Transistors-Part II Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability" IEEE Transactions on Electron Devices, vol. 59, no. 10, pp. 2699-2706, 2012-10 PDF
  • 103 Y. Kim, M. Bae, W. Kim, D. Kong, H. K. Jeong, H. Kim, S. Choi, D. M. Kim, and D. H. Kim "Amorphous InGaZnO Thin-Film Transistors-Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range" IEEE Transactions on Electron Devices, vol. 59, no. 10, pp. 2689-2698, 2012-10 PDF
  • 102 E. Hong, D. Yun, H. Bae, H. Choi, W. H. Lee, M. Uhm, H. Seo, J. Lee, J. Jang, D. H. Kim, and D. M. Kim "Subbandgap Optical Differential Body-Factor Technique and Characterization of Interface States in SOI MOSFETs" IEEE Electron Device Letters, vol. 33, no. 7, pp. 922-924, 2012-07 PDF
  • 101 H.-H. Nahm, Y.-S. Kim, and D. H. Kim "Instability of amorphous oxide semiconductors via carrier-mediated structural transition between disorder and peroxide state" Phys. Status Solid, B 249, no. 6, pp. 1277-1281, 2012-02 PDF
  • 100 I.-T. Cho, I.-J. Park, D. Kong, D. H. Kim, J.-H. Lee, S.-H. Song, and H.-I. Kwon "Extraction of the Channel Mobility in InGaZnO TFTs Using Multifrequency Capacitance-Voltage Method" IEEE Electron Device Letters, vol. 33, no. 6, pp. 815-817, 2012-06 PDF
  • 99 S. Y. Lee, D. H. Kim, B. Kim, H. K. Jung, and D. H. Kim "Comparative analysis of temperature thermally induced instability between Si–In–Zn–O and Ga–In–Zn–O thin film transistors" Thin-Solid Films vol. 520, vol. 520, no. 10, pp. 3796-3799, 2012-03 PDF
  • 98 H. Bae, S. Jun, C. Jo, H. Choi, J. Lee, Y. H. Kim, S. Hwang, H. K. Jeong, I. Hur, W. Kim, D. Yun, E. Hong, H. Seo, D. H. Kim, and D. M. Kim "Modified Conductance Method for Extraction of Subgap Density-of-States in a-IGZO Thin-Film Transistors" IEEE Electron Device Letters, vol. 33, no. 8, pp.. 1138-1140, 2012-08 PDF
  • 97 I.-Y. Chung, H. Jang, J. Lee, H. Moon, S. M. Seo, and D. H. Kim "Simulation study on discrete charge effects of SiNW biosensors according to bound target position using a 3D TCAD simulator" IOP Science Nanotechnology, vol. 23, p. 065202, 2012-01 PDF
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