Prof. Kim`s R.P.

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  • 130 J. C. Park, I.-T. Cho, E.-S. Cho, D. H. Kim, C.-Y. Jeong, and H.-I. Kwon "Comparative Study of ZrO2 and HfO2 as a High-k Dielectric for Amorphous InGaZnO Thin Film Transistors" Journal of Nanoelectronics and Optoelectronics, vol. 9, pp. 67-70, 2014-02
  • 129 J. Lee, B. Choi, S. Hwang, J. H. Lee, B.-G. Park, T. J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi "Investigation of Sensor Performance in Accumulation- and Inversion-Mode Silicon Nanowire pH Sensors" IEEE Transactions on Electron Devices, vol. 61. no. 5 pp. 1607-1610, 2014-05
  • 128 W. H. Lee, J.-M. Lee, M. Uhm, J. Lee, K. R. Kim, S.-J. Choi, D. M. Kim, Y.-J. Jeong, and D. H. Kim "Characterization and Capacitive Modeling of Target Concentration-Dependent Subthreshold Swing in Silicon Nanoribbon Biosensors" IEEE Electron Device Letters, vol. 35. no. 5. pp 587-589, 2014-05
  • 127 J. Lee, J. Jang, H. Kim, J. Lee, B.L. Lee, S.-J. Choi, D. M. Kim, D. H. Kim, and K. R. Kim "Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors" IEEE Electron Device Letters, vol, 35, no. 3, pp. 396-398, 2014-02
  • 126 S. Kim, J. C. Park, D. H. Kim, and J.-S. Lee "Effects of Hf Incorporation on Negative Bias-Illumination Stress Stability in Hf–In–Zn–O Thin-Film Transistors" J. Appl. Phys., vol. 52, p. 041701, 2013-05
  • 125 J. Lee, S. Jun, J. Jang, H. Bae, H. Kim, J. W. Chung, S. -J. Choi, D. H. Kim, J. Lee, and D. M. Kim "Fully Transfer Characteristic-based Technique for Surface Potential and Subgap Density-of-States in p-Channel Polymer-based TFTs" IEEE Electron Device Letters, vol. 34, No. 12, pp. 1521-1523, 2013-11
  • 124 M. Bae, K. M. Lee, E.-S. Cho, H.-I. Kwon, D. M. Kim, and D. H. Kim "Analytical Current and Capacitance Models for Amorphous Indium-Gallium-Zinc-Oxide" IEEE Transactions Electron Devices, vol. 60, No. 10, pp. 3465-3473, 2013-10
  • 123 D. H. Kim, H. K. Jung, W. Yang, D. H. Kim, and S. Y. Lee "Investigation on mechanism for instability under drain current stress in amorphous Si–In–Zn–O thin-film transistors"" Thin Solid Films, vol. 527, pp. 314-317, 2013-01, 2013-01
  • 122 J. S. Shin, H. Bae, E. Hong, J. Jang, D. Yun, J. Lee, D. H. Kim, and D. M. Kim "Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I-V and low frequency C-V measurement" Solid-State Electron, , 2012-01
  • 121 H. Bae, H. Choi, S. Jun, C. Jo, Y. H. Kim, J. S. Hwang, J. Ahn, S. Oh, J. -U. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim "Single Scan Monochromatic Photonic Capacitance -Voltage Technique for Extraction of Subgap DOS over the Bandgap in Amorphous Semiconductor TFTs" IEEE Electron Device Letters, vol. 34, no. 12, pp. 1524-1526, 2013-09
  • 120 J. Kim, J. Jang, M. Bae, J. Lee, W. Kim, I. Hur, H. K. Jeong, D. M. Kim, and D. H. Kim "Characterization of Density-of-States in Polymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator" Journal of Semiconductor Technology and Science, vol. 13, No. 1, pp. 43-47, 2013-02
  • 119 J.-Y. Noh, H. Kim, H.-H. Nahm, Y.-S. Kim, D. H. Kim, B.-D. Ahn, J.-H. Lim, G. H. Kim, J.-H. Lee, and J. Song "Cation composition effects on electronic structures of In-Sn-Zn-O amorphous semiconductors" J. Appl. Phys., vol. 113, p. 183706, 2013-05
  • 118 J. Lee, J. W. Chung, J. Jang, D. H. Kim, J.-I. Park, E. Lee, B.-L. Lee, J. Y. Kim, J. Y. Jung, J. S. Park, B. Koo, Y. W. Jin, and D. H. Kim "Influence of alkyl side-chain on the crystallinity and trap density of states in thiophene and thiazole semiconducting copolymer based inkjet-printed field-effect transistors" Chemistry of Materials, vol. 25, pp. 1927-1934, 2013-04
  • 117 A. D. Q. Nguyen, S.-W. Kim, S. B. Kim, Y.-G. Seo, I.-Y. Chung, D. H. Kim, and C. -J. Kim "Production of β-carotene and Acetate in Recombinant Escherichia coli with or without Mevalonate Pathway at Different Culture Temperature or pH" Biotechnol. Bioprocess Eng., vol. 17, Issue 6, pp. 1196-1204, 2012-12
  • 116 D. H. Kim , S. Park, Y. J. Seo, T. G. Kim , D. M. Kim, and I. H. Cho "Comparative investigation of endurance and bias temperature instability characteristics in metal-Al 2 O 3 -nitride-oxide-semiconductor (MANOS) and semiconductor-oxide-nitride-oxide-semiconductor (SONO" Journal of Semiconductor Technology and Science, vol. 12, No. 4, pp.449-457, 2012-12
  • 115 H. Jang , J. Lee , J. H. Lee , S. Seo , B.-G. Park , D. M. Kim , D. H. Kim , and I.-Y. Chung "Analysis of hysteresis characteristics of silicon nanowire biosensors in aqueous environment" Appl. Phys., vol. 99, Issue 25, p. 252103, 2011-11
  • 114 S. Lee, Y. W. Jeon, S. Kim, D. Kong, D. H. Kim , and D. M. Kim "Comparative Study of Quasi-Static and Normal Capacitance-Voltage Characteristics in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors" Solid-State Electronics, vol. 56, pp. 95-99, 2010-11
  • 113 S.H. Kim, D.-I. Moon, W. Lu, D. H. Kim, D. M. Kim, Y.-K. Choi, and S.‐J. Choi "Latch-up based bidirectional npn selector for bipolar resistance-change memory" Applied Physics Letters, vol. 103, issue. 3, p. 033505, 2013-07
  • 112 S. Jun, C. Jo, H. Bae, H. Choi, D. H. Kim, and D. M. Kim "Unified Subthreshold Coupling Factor Technique for Surface Potential and Subgap Density-of-States in Amorphous Thin Film Transistors" IEEE Electron Device Letters, vol. 34, no. 5, pp. 641-643, 2013-05
  • 111 C. Jo, S. Jun, W. Kim, I. Hur, H. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim "Characterization of density-of-states and parasitic resistance in a-InGaZnO thin-film transistors after negative bias stress" Appl. Phys. Letters, vol. 102, issue. 5, p. 143502, 2013-04
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