130J. C. Park, I.-T. Cho, E.-S. Cho, D. H. Kim, C.-Y. Jeong, and H.-I. Kwon"Comparative Study of ZrO2 and HfO2 as a High-k Dielectric for Amorphous InGaZnO Thin Film Transistors"Journal of Nanoelectronics and Optoelectronics, vol. 9, pp. 67-70, 2014-02
129J. Lee, B. Choi, S. Hwang, J. H. Lee, B.-G. Park, T. J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi"Investigation of Sensor Performance in Accumulation- and Inversion-Mode Silicon Nanowire pH Sensors"IEEE Transactions on Electron Devices, vol. 61. no. 5 pp. 1607-1610, 2014-05
128W. H. Lee, J.-M. Lee, M. Uhm, J. Lee, K. R. Kim, S.-J. Choi, D. M. Kim, Y.-J. Jeong, and D. H. Kim"Characterization and Capacitive Modeling of Target Concentration-Dependent Subthreshold Swing in Silicon Nanoribbon Biosensors"IEEE Electron Device Letters, vol. 35. no. 5. pp 587-589, 2014-05
127J. Lee, J. Jang, H. Kim, J. Lee, B.L. Lee, S.-J. Choi, D. M. Kim, D. H. Kim, and K. R. Kim"Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors"IEEE Electron Device Letters, vol, 35, no. 3, pp. 396-398, 2014-02
126S. Kim, J. C. Park, D. H. Kim, and J.-S. Lee"Effects of Hf Incorporation on Negative Bias-Illumination Stress Stability in Hf–In–Zn–O Thin-Film Transistors"J. Appl. Phys., vol. 52, p. 041701, 2013-05
125J. Lee, S. Jun, J. Jang, H. Bae, H. Kim, J. W. Chung, S. -J. Choi, D. H. Kim, J. Lee, and D. M. Kim"Fully Transfer Characteristic-based Technique for Surface Potential and Subgap Density-of-States in p-Channel Polymer-based TFTs"IEEE Electron Device Letters, vol. 34, No. 12, pp. 1521-1523, 2013-11
124M. Bae, K. M. Lee, E.-S. Cho, H.-I. Kwon, D. M. Kim, and D. H. Kim"Analytical Current and Capacitance Models for Amorphous Indium-Gallium-Zinc-Oxide"IEEE Transactions Electron Devices, vol. 60, No. 10, pp. 3465-3473, 2013-10
123D. H. Kim, H. K. Jung, W. Yang, D. H. Kim, and S. Y. Lee"Investigation on mechanism for instability under drain current stress in amorphous Si–In–Zn–O thin-film transistors""Thin Solid Films, vol. 527, pp. 314-317, 2013-01, 2013-01
122J. S. Shin, H. Bae, E. Hong, J. Jang, D. Yun, J. Lee, D. H. Kim, and D. M. Kim"Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I-V and low frequency C-V measurement"Solid-State Electron, , 2012-01
121H. Bae, H. Choi, S. Jun, C. Jo, Y. H. Kim, J. S. Hwang, J. Ahn, S. Oh, J. -U. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim"Single Scan Monochromatic Photonic Capacitance -Voltage Technique for Extraction of Subgap DOS over the Bandgap in Amorphous Semiconductor TFTs"IEEE Electron Device Letters, vol. 34, no. 12, pp. 1524-1526, 2013-09
120J. Kim, J. Jang, M. Bae, J. Lee, W. Kim, I. Hur, H. K. Jeong, D. M. Kim, and D. H. Kim"Characterization of Density-of-States in Polymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator"Journal of Semiconductor Technology and Science, vol. 13, No. 1, pp. 43-47, 2013-02
119J.-Y. Noh, H. Kim, H.-H. Nahm, Y.-S. Kim, D. H. Kim, B.-D. Ahn, J.-H. Lim, G. H. Kim, J.-H. Lee, and J. Song"Cation composition effects on electronic structures of In-Sn-Zn-O amorphous semiconductors"J. Appl. Phys., vol. 113, p. 183706, 2013-05
118J. Lee, J. W. Chung, J. Jang, D. H. Kim, J.-I. Park, E. Lee, B.-L. Lee, J. Y. Kim, J. Y. Jung, J. S. Park, B. Koo, Y. W. Jin, and D. H. Kim"Influence of alkyl side-chain on the crystallinity and trap density of states in thiophene and thiazole semiconducting copolymer based inkjet-printed field-effect transistors"Chemistry of Materials, vol. 25, pp. 1927-1934, 2013-04
117A. D. Q. Nguyen, S.-W. Kim, S. B. Kim, Y.-G. Seo, I.-Y. Chung, D. H. Kim, and C. -J. Kim"Production of β-carotene and Acetate in Recombinant Escherichia coli with or without Mevalonate Pathway at Different Culture Temperature or pH"Biotechnol. Bioprocess Eng., vol. 17, Issue 6, pp. 1196-1204, 2012-12
116D. H. Kim , S. Park, Y. J. Seo, T. G. Kim , D. M. Kim, and I. H. Cho"Comparative investigation of endurance and bias temperature instability characteristics in metal-Al 2 O 3 -nitride-oxide-semiconductor (MANOS) and semiconductor-oxide-nitride-oxide-semiconductor (SONO"Journal of Semiconductor Technology and Science, vol. 12, No. 4, pp.449-457, 2012-12
115H. Jang , J. Lee , J. H. Lee , S. Seo , B.-G. Park , D. M. Kim , D. H. Kim , and I.-Y. Chung"Analysis of hysteresis characteristics of silicon nanowire biosensors in aqueous environment"Appl. Phys., vol. 99, Issue 25, p. 252103, 2011-11
114S. Lee, Y. W. Jeon, S. Kim, D. Kong, D. H. Kim , and D. M. Kim"Comparative Study of Quasi-Static and Normal Capacitance-Voltage Characteristics in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors"Solid-State Electronics, vol. 56, pp. 95-99, 2010-11
113S.H. Kim, D.-I. Moon, W. Lu, D. H. Kim, D. M. Kim, Y.-K. Choi, and S.‐J. Choi"Latch-up based bidirectional npn selector for bipolar resistance-change memory"Applied Physics Letters, vol. 103, issue. 3, p. 033505, 2013-07
112S. Jun, C. Jo, H. Bae, H. Choi, D. H. Kim, and D. M. Kim"Unified Subthreshold Coupling Factor Technique for Surface Potential and Subgap Density-of-States in Amorphous Thin Film Transistors"IEEE Electron Device Letters, vol. 34, no. 5, pp. 641-643, 2013-05
111C. Jo, S. Jun, W. Kim, I. Hur, H. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim"Characterization of density-of-states and parasitic resistance in a-InGaZnO thin-film transistors after negative bias stress"Appl. Phys. Letters, vol. 102, issue. 5, p. 143502, 2013-04