Prof. Kim`s R.P.

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  • 208 B. Choi, J. Yoon, Y. Lee, J. Han, J. Lee, Y. Kim, J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi* "A pseudo-CMOS inverter with top-gated 99% semiconducting carbon nanotube network transistors" The 24th Korean Conference on Semiconductors, 2018-02
  • 207 Y. Lee, B. Choi, J. Yoon, J. Han, J. Lee, J. Park, Y. Kim, D. M. Kim, D. H. Kim, and S.-J. Choi* "99% semiconducting carbon nanotube-based diode and application in logic circuits" The 24th Korean Conference on Semiconductors, 2018-02
  • 206 J. Park, B. Choi, J. Yoon, Y. Lee, J. Han, J. Lee, Y. Kim, D. M. Kim, D. H. Kim, and S.-J. Choi* "Directly drawn carbon nanotube transistors with a high device yield and uniform performance" The 24th Korean Conference on Semiconductors, 2018-02
  • 205 Y. Kim, B. Choi, J. Yoon, Y. Lee, J. Han, J. Lee, J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi* "Optimization of the performance in humidity sensor based on pre-separated 99% metallic single-walled carbon nanotube" The 24th Korean Conference on Semiconductors, 2018-02
  • 204 G. Ahn, J. T. Jang, D. Ko, H. Yu, H. Jung, J. Rhee, H.-S. Mo, S.-J. Choi, D. M. Kim, D. H. Kim "Analysis of LRS retention fail based on Joule heating effect in InGaZnO RRAM" The 24th Korean Conference on Semiconductors, 2018-02
  • 203 S. Choi, J.-Y. Kim, J. Kim, J. Rhee, H. R. Yu, H. Kang, S.-J. Choi, D. M. Kim, and D. H. Kim "Extraction Method of Temperature-Independent Subgap Density-of-States of a-IGZO TFTs by using Fermi-Dirac distribution" The 24th Korean Conference on Semiconductors, 2018-02
  • 202 H. R. Yu, J. T. Jang, G. Ahn, S.-J. Choi, D. M. Kim, and D. H. Kim "Study on Negative Bias Stress-induced Instability in Zinc Oxynitride Thin-Film Transistors using Systematic Decomposition" The 24th Korean Conference on Semiconductors, 2018-02
  • 201 J. T. Jang, S.-J. Choi, D. M. Kim, D. H. Kim "Activation Energy Window-Based Modeling on the NBIS-induced Instability in Amorphous InGaZnO Thin-Film Transistors" ICEIC, 2018-01
  • 200 J. Yoon†, B. Choi†, Y. Lee, J. Han, J. Lee, J. Park, Y. Kim, D. M. Kim, D. H. Kim, M.-H. Kang, S. Kim*, S.-J. Choi*( †These authors equally contributed to this work)(*co-corresponding authors) "Monolithically 3D-Printed Pressure Sensors for Application in Electronic Skin and Healthcare Monitoring" IEDM, 2017-12
  • 199 J. Yoon§, B. Choi§, Y. Lee, J. Lee, J. Park, Y. Kim, D. M. Kim, D. H. Kim, M.-H. Kang, S. Kim, and S.-J. Choi "Monolithically 3D-Printed Pressure Sensors for Application in Electronic Skin Healthcare Monitoring" IEDM, 2017-09
  • 198 J. Rhee, S. Choi, J.-Y. Kim, S.-J. Choi, D. M. Kim,and D. H. Kim* "Relationship between the tunneling distance and stretched-exponential function model on the positive bias stress-induced charge trapping in IGZO TFTs" IMID 2017, 2017-08
  • 197 B. Choi, J. Yoon, D. M. Kim, D. H. Kim, and S.-J. Choi "High-performance top-gated 99% semiconducting carbon nanotube network transistor with high device yield and uniformity" NANO KOREA, 2017-07
  • 196 J. Yoon, J. Han, B. Choi, D. M. Kim, D. H. Kim, and S.-J. Choi "Carbon nanotube transistor on 3-D printed polyvinyl alcohol (PVA) substrate for transient electronics" NANO KOREA, 2017-07
  • 195 Y. Lee, J. Yoon, B. Choi, H. Lee, D. M. Kim, D. H. Kim, and S.-J. Choi "High-performance, ink-jet printed 99% semiconducting carbon nanotube transistors with enhanced contact interfaces" NANO KOREA, 2017-07
  • 194 D. H. Kim, S. Choi, J. Jang, H Kang, D. M. Kim, S.-J. Choi, Y.-S. Kim, S. Oh, J. H. Baeck, J. U. Bae, K.-S. Park, S. Y. Yoon, and In B. Kang "Experimental Decomposition of the Positive Gate-bias Temperature Stressinduced Instability and Its Modeling in InGaZnO Thin-film Transistors" IMID 2017, 2017-07
  • 193 D. H. Kim, S. Choi, J. Jang, H. Kang, D. M. Kim, S.-J. Choi, Y.-S. Kim, S. Oh, J. H. Baeck, J. U. Bae, K.-S. Park, S. Y. Yoon, and In B. Kang "Experimental Decomposition of the Positive Bias Temperature Stressinduced Instability in Self-aligned Coplanar InGaZnO Thin-film Transistors and its Modeling based on the Multiple Stretched-exponentia" Society of Information Display, 2017-05
  • 192 S. K. Kim, J.-P. Shim, D.-M. Geum, C. Z. Kim, H.-S. Kim, Y-S Kim, H.-K. Kang, J.-D. Song, S.-J. Choi, D. H. Kim, W. J. Choi, H.-J Kim, D. M. Kim* and S.-H. Kim* "High-performance In0.53Ga0.47As-OI MOSFET on Si substrates" The 24th Korean Conference on Semiconductors, 2017-02
  • 191 J. Kim, H. Lee, H. Bae, O. Seok, S.-J. Choi, D. H. Kim, and D. M. Kim "Characterization of Heterojunction Interface Traps in AlGaN/GaN HEMTs through Sub-Bandgap Photonic Response and Subthreshold Ideality Factor" The 24th Korean Conference on Semiconductors, 2017-02
  • 190 S. K. Kim, J.-P. Shim, D.-M. Geum, C. Z. Kim, H.-S. Kim, Y.-S. Kim, H.-K. Kang, J.-D. Song, S.-J. Choi, D. H. Kim, W. J. Choi, H.-j. Kim, D. M. Kim* and S. H. Kim* "Fabrication of In-Rich(>0.53) InGaAs-OI on Si by Novel Epitaxial Lift-Off" The 24th Korean Conference on Semiconductors, 2017-02
  • 189 J. Jang, J. Kim, H.-S. Mo, J. Park, B.-G. Park, S.-J. Choi, D. M. Kim, and D. H. Kim* "Experimental analysis on the setup/hold time in readout condition of Si nanowire FET-based biosensors for detecting ion and/or biomolecule in analyte solution" The 24th Korean Conference on Semiconductors, 2017-02
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