108J. Lee, J. H. Lee, M. Uhm, W. H. Lee, S. Hwang, B. S. Choi, B.-G. Park,D. M. Kim, and D. H. Kim"Implementation and Characterization of Gate-Induced Drain Leakage Current-Based Multiplexed SiNW Biosensor"The 20th Korean Conference on Semiconductors, 2013-02
107H. Bae, H. Choi, S. Jun, C. Jo, Y. H. Kim, J. Lee, S. Hwang, Euiyeon Hong, I. Hur, J. S. Hwang, J. Ahn, D. G. Kim, B. S. Choi, S. Oh, D.-H. Kim, J. Bae, and D. M. Kim"Monochromatic Photonic Capacitance-Voltage Technique for Donor- and Acceptor-Like Density-of-States over the Full-Energy Range in Amorphous TFTs"The 20th Korean Conference on Semiconductors, 2013-02
106S. Hwang, J. Lee, W. H. Lee, M. Uhm, B. S. Choi, H. Bae, S. Oh, Y. Kim, H. H. Lee, D. M. Kim, and D. H. Kim"Detection of a Specific Target DNA through the Threshold Voltage Shift in Silicon Nanowire FET-based Biosensors"The 20th Korean Conference on Semiconductors, 2013-02
105H. Bae, H. Choi, S. Jun, C. Jo, Y. H. Kim, J. Lee, S. Hwang, E. Hong, I. Hur, D. J. Shin, K. M. Lee, H. Kim, S. Oh, D.-H. Kim, J. Bae, and D. M. Kim"Photonic Capacitance-Voltage Technique for Intrinsic Subgap-DOS Considering the Parasitic Capacitance in Amorphous Oxide Semicondctors"The 20th Korean Conference on Semiconductors, 2013-02
104김윤혁, 김대근, 황인록, 장재만, 배학열, 이재욱, 전성우, 조춘형, 최현준, 최선웅, 민경식, 박배호, 김동명, 김대환"Simple Empirical I-V Model for Memristive Switches and Its Application for SPICE"The 20th Korean Conference on Semiconductors, 2013-02
103J. Kim, J. Jang, J. Lee, W. Kim, I. Hur, C. Jo, S. Jun, H. Kim, K. M. Lee, D. J. Shin, D. M. Kim, and D. H. Kim"Analytical Current Model for Polymer-based Thin Film Transistors Considering the Field-Dependent Mobility and Nonlinearity in the Linear Region"The 20th Korean Conference on Semiconductors, 2013-02
102C. Jo, S. Jun, W. Kim, I. Hur, J. Jang, J. Kim, J. Lee, Y. H. Kim, H. Bae, D. J. Shin, K. M. Lee, H. Kim, D. H. Kim, and D. M. Kim"Characterization of Negative Bias Stress Instability Mechanisms in Amorphous InGaZnO Thin Film Transistors"The 20th Korean Conference on Semiconductors, 2013-02
101W. H. Lee, J.-M. Lee, M. Uhm, J. Lee, J. H. Lee, H. Bae, E. Hong, S. Hwang, Y. H. Kim, B. S. Choi, B.-G. Park, D. M. Kim, Y.-J. Jeong, and D. H. Kim"Characterization of Subthreshold Slope Degradation in CMOS-based Silicon Nanowire Biosensors"The 20th Korean Conference on Semiconductors, 2013-02
100H. Seo, H. Bae, C. Jo, E. Hong, H. Choi, J. S. Hwang, J. Ahn, D. H. Kim, and D. M. Kim"Characterization of Free Electron-Deembedded Subgab Density-of-States in a-IGZO TFTs from the Sub-Bandgap Optical Subthreshold Characteristics"The 20th Korean Conference on Semiconductors, 2013-02
99J. Lee, J. Jang, J. Kim, S. Jun, C. Jo, Y. H. kim, W. Kim, I. Hur, H. Kim, K. M. Lee, D. J. Shin, D. M. Kim, and D. H. Kim"Negative Bias Stress Instability Mechanism in Polymer-Based Thin-Film TransistorsThe 20th Korean Conference on Semiconductors"The 20th Korean Conference on Semiconductors, 2013-02
98D. H. Kim, W. Kim, Y. Kim, I. Hur, M. Bae, D. Kong, H. K. Jeong, D. M. Kim"Physical Model and Simulation Platform for High-Level Instability-Aware Design of Amorphous Oxide Semiconductor Thin-Film Transistors"in SID'12 Dig. Tech. Papers, 2012-05
97H. K. Jeong, I. Hur, W. Kim, J. Kim, D. Kong, Y. Kim, M. Bae, S. Choi, D. M. Kim, and D. H. Kim"Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors"in SID'12 Dig. Tech. Papers, 2012-05
96Y.-S. Kim, H.-H. Nahm, and D. H. Kim"Microscopic Mechanism of the Negative Bias and Illumination Stress Instability of Amorphous Oxide TFTs"in SID'12 Dig. Tech. Papers, 2012-05
95J. Lee, J. H. Lee, H. Jang, M. Uhm, W. H. Lee, S. Hwang, B.-G. Park, I.-Y. Chung, D. M. Kim and D. H. Kim"CMOS-Compatible Inverter-Type Si Nanoribbon Biosensor with High Sensitivity"The 19th Korean Conference on Semiconductors, 2012-02
94정현광, 공동식, 김용식, 배민경, 김재형, 김우준, 허인석, 이재욱, 김윤혁, 전성우, 조춘형, 김동명, 김대환"Amorphous Silicon 박막트랜지스터의 Negative Bias Illumination Stress 하에서의 물리적 Parameter 기반 신뢰성 특성 분석"The 19th Korean Conference on Semiconductors, 2012-02
93H. Bae, D. Kong, J. S. Shin, D. Yun, E. Hong, H. Seo, H. Choi, J. Lee, H.-K. Jung, M. Bae, Y. Kim, W. Kim, D. H. Kim, and D. M. Kim"Active Layer Thickness-Dependent Parasitic Resistance Effect in Low Frequency Noise with Subgap Density-of-States in Amorphous Indium-Gallium-Zinc-Oxide TFTs"The 19th Korean Conference on Semiconductors, 2012-02
92M. Bae, D. Yun, Y. Kim, D. Kong, H. Jeong, J. Jang, W. Kim, I. Hur, J. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. H. Kim, and D. M. Kim"Differential Ideality Factor Technique and Extraction of Subgap Density-of-States in Amorphous InGaZnO Thin-Film Transistors"The 19th Korean Conference on Semiconductors, 2012-02
91I. Hur, H. Bae, M. Bae, Y. Kim, D. Kong, H. Jeong, J. Jang, J. Kim, W. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. M. Kim, and D. H. Kim"Characterization of Intriinsic Field Effect Mobiliity in a-IGZO Thin-Film Transistors Through the De-embedding the Parasitic Source and Drain Resistance Effects"The 19th Korean Conference on Semiconductors, 2012-02
90J. Kim, J. Jang, M. Bae, W. Kim, I. Hur, Y. Kim, H. Jeong, D. Kong, J. Lee, Y. H. Kim, S. Jun, C. H. Jo, D. M. Kim,and D. H. Kim"Characterization of Density-of-States in olymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator"The 19th Korean Conference on Semiconductors, 2012-02
89김우준, 배민경, 김용식, 김재형, 허인석, 장재만, 정현광, 공동식, 김윤혁 이재욱, 조춘형, 전성우, 김동명, 김대환"Analytical Model-based SPICE Simulation ofr the Design of Amorphous InGaZnO Thin-Film Transistors-based Circuits"The 19th Korean Conference on Semiconductors, 2012-02