Prof. Kim`s R.P.
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- 108 "Implementation and Characterization of Gate-Induced Drain Leakage Current-Based Multiplexed SiNW Biosensor" The 20th Korean Conference on Semiconductors, 2013-02
- 107 "Monochromatic Photonic Capacitance-Voltage Technique for Donor- and Acceptor-Like Density-of-States over the Full-Energy Range in Amorphous TFTs" The 20th Korean Conference on Semiconductors, 2013-02
- 106 "Detection of a Specific Target DNA through the Threshold Voltage Shift in Silicon Nanowire FET-based Biosensors" The 20th Korean Conference on Semiconductors, 2013-02
- 105 "Photonic Capacitance-Voltage Technique for Intrinsic Subgap-DOS Considering the Parasitic Capacitance in Amorphous Oxide Semicondctors" The 20th Korean Conference on Semiconductors, 2013-02
- 104 "Simple Empirical I-V Model for Memristive Switches and Its Application for SPICE" The 20th Korean Conference on Semiconductors, 2013-02
- 103 "Analytical Current Model for Polymer-based Thin Film Transistors Considering the Field-Dependent Mobility and Nonlinearity in the Linear Region" The 20th Korean Conference on Semiconductors, 2013-02
- 102 "Characterization of Negative Bias Stress Instability Mechanisms in Amorphous InGaZnO Thin Film Transistors" The 20th Korean Conference on Semiconductors, 2013-02
- 101 "Characterization of Subthreshold Slope Degradation in CMOS-based Silicon Nanowire Biosensors" The 20th Korean Conference on Semiconductors, 2013-02
- 100 "Characterization of Free Electron-Deembedded Subgab Density-of-States in a-IGZO TFTs from the Sub-Bandgap Optical Subthreshold Characteristics" The 20th Korean Conference on Semiconductors, 2013-02
- 99 "Negative Bias Stress Instability Mechanism in Polymer-Based Thin-Film TransistorsThe 20th Korean Conference on Semiconductors" The 20th Korean Conference on Semiconductors, 2013-02
- 98 "Physical Model and Simulation Platform for High-Level Instability-Aware Design of Amorphous Oxide Semiconductor Thin-Film Transistors" in SID'12 Dig. Tech. Papers, 2012-05
- 97 "Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors" in SID'12 Dig. Tech. Papers, 2012-05
- 96 "Microscopic Mechanism of the Negative Bias and Illumination Stress Instability of Amorphous Oxide TFTs" in SID'12 Dig. Tech. Papers, 2012-05
- 95 "CMOS-Compatible Inverter-Type Si Nanoribbon Biosensor with High Sensitivity" The 19th Korean Conference on Semiconductors, 2012-02
- 94 "Amorphous Silicon 박막트랜지스터의 Negative Bias Illumination Stress 하에서의 물리적 Parameter 기반 신뢰성 특성 분석" The 19th Korean Conference on Semiconductors, 2012-02
- 93 "Active Layer Thickness-Dependent Parasitic Resistance Effect in Low Frequency Noise with Subgap Density-of-States in Amorphous Indium-Gallium-Zinc-Oxide TFTs" The 19th Korean Conference on Semiconductors, 2012-02
- 92 "Differential Ideality Factor Technique and Extraction of Subgap Density-of-States in Amorphous InGaZnO Thin-Film Transistors" The 19th Korean Conference on Semiconductors, 2012-02
- 91 "Characterization of Intriinsic Field Effect Mobiliity in a-IGZO Thin-Film Transistors Through the De-embedding the Parasitic Source and Drain Resistance Effects" The 19th Korean Conference on Semiconductors, 2012-02
- 90 "Characterization of Density-of-States in olymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator" The 19th Korean Conference on Semiconductors, 2012-02
- 89 "Analytical Model-based SPICE Simulation ofr the Design of Amorphous InGaZnO Thin-Film Transistors-based Circuits" The 19th Korean Conference on Semiconductors, 2012-02
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