19D. H. Kim, J. Jang, K. M. Lee, S. -J. Choi, and D. M. Kim"Subgap Density-of-States (DOS)-based Simulation for Instability-Aware Design of Oxide TFTs"CAD-TFT 2014, 2014-10
18K. M. Lee, J. T. Jang, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim"Negative Bias Illumination Stress Time-Evolution of Subgap States in Amorphous InGaZnO Thin-Film Transistors: Oxygen Vacancy?"IMID 2014 DIGEST, p. 11, 2014-08
17D. H. Kim, J. Jang, K. M. Lee, S.-J. Choi, and D. M. Kim"Toward instability-aware design of oxide TFTs(Invited)"IMID 2014 DIGEST, p. 198, 2014-08
16J. Jang, S.-J. Choi, D. M. Kim, J.-H. Lim, J.-H. Lee, B. D. Ahn, and D. H. Kim"Negative Bias Illumination Stress-Induced Instability in Amorphous Indium-Tin- Zinc-Oxide TFTs and Its Comparison with Indium-Gallium-Zinc-Oxide TFTs"IMID 2014 DIGEST, p. 199, 2014-08
15J. T. Jang, K. M. Lee, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim"The Effect of RF Sputtering Power on Negative Bias Illumination Stress-Induced Instability in Sputtered Amorphous InGaZnO Thin-Film Transistors"IMID 2014 DIGEST, p. 358, 2014-08
14S. Choi, J. Jang, H. Kim, D. G. Kim, K. M. Lee, J. H. Kim, D. M. Kim, S.-J. Choi, J. C. Park, and D. H. Kim"VGS/VDS Configuration-Dependence of Positive Bias Stress-Induced Instability in Self-Aligned Top-Gate IZO TFTs"IMID 2014 DIGEST, p. 359, 2014-08
13J. Yoon, D. Lee, C. Kim, J. Lee, B. Choi, N. Yoder, J. Humes, D. H. Kim, D. M. Kim, M. Lee, Y.-K. Choi, and S.-J. Choi"Highly separated semiconducting carbon nanotube (99.9%) thin-film transistor using printing technology"IMID 2014 DIGEST, p. 568, 2014-08
12J. S. Hwang, H. Bae, H. Choi, J. Ahn, J. Lee, S.-J Choi, D. H. Kim, and D. M. Kim"A Dual Sweep Transfer Curve Technique for Separate Extraction of Source and Drain Resistances in Advanced FETs without Substrate Contacts"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
11J. Ahn, H. Bae, H. Choi, J. S. Hwang, J. Lee, S.-J. Choi, D. H.Kim, and D. M. Kim"A Novel Characterization Technique for Location of Laterally Distributed Grain Boundary in Polycrystalline Silicon Thin-Film Transistors"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
10H. Choi, H. Bae, J. Ahn, J. S. Hwang, J. Lee, S.-J. Choi, D. H. Kim, and D. M. Kim"Capacitance-Voltage Technique for Extraction of Intrinsic Subgap DOS in AOS TFTs with Bias-Dependent Channel Conduction Factor Model"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
9B. Choi, J. Lee, D. M. Kim, D. H. Kim, and S.-J. Choi"An accurate and efficient simulation technique for FET-type biosensors"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
8Y. H. Kim, D. G. Kim, J.-D. Kim, S.-J. Choi, D. M. Kim, T.-S. Yoon, and D. H. Kim"Characterization of γ-Fe2O3 memristors via physics-based empirical I-V model"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
7S. Choi, J. Jang, H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. M. Kim, D. J. Shin, S.-J. Choi, D. M. Kim, and D. H. Kim"Constant current stress-induced instability of the top-gate IZO TFTs for AMOLED displays"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
6D. Shin, S. Jun, K. M. Lee, H. Kim, C. Jo, J. Jang, J. Lee, S.-J. Choi, D. M. Kim, and D. H. Kim"Effect of ultra-thin active layer thickness on the subthreshold slope and bipolar bias stress-induced degradation in amorphous InGaZnO thin-film transistors"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
5H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. Min Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"Effect of gate/drain voltage configuration on electrical degradation of the bottom-gate In-Ga-Zn-O thin-film transistors driving AMOLED displays"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
4J. T. Jang, K. M. Lee, H. Kim, J. Jang, D. J. Shin, S. Choi, J. Lee, C. Jo, S. Jun, S.-J. Choi, D. M. Kim, and D. H. Kim"Effect of the RF power in sputter system on performance and photoelectric degradation of amorphous indium-gallium-zinc-oxide thin-film transistors"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
3K. M. Lee, S. Jun, H. Kim, C. Jo, J. Jang, J. Lee, D. J. Shin, J. T. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"Oxygen vacancy-dependent density-of-states and its effect on the negative bias illumination stress-induced degradation in amorphous oxide semiconductor thin-film transistors"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
2J. Lee, J. Jang, H. Kim, C. Jo, S. Jun, K. M. Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"The Effect of Passivation on the Positive Bias Stress-Induced Instability of Polymer Thin-Film Transistors"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02
1C. Jo, H. Kim, S. Jun, D. J. Shin, K. M. Lee, J. Jang, J. Lee, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"Study on Physical Mechanism on the Positive Bias Stress-Induced Degradation ofAmorphous InGaZnO Thin-Film Transistors with Density-of-States BasedCharacterization"The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02