83J.-Y. Kim, S. Choi, H. Kang, J. T. Jang, D. Ko, J. Rhee, Y. H. Ri, S.-J. Choi, D. M. Kim, and D. H. Kim*"Influence of the oxygen flow rate during sputter deposition on the current stress instability in bottom-gate amorphous InGaZnO Thin-Film Transistors"The 24th Korean Conference on Semiconductors, 2017-02
82D. Ko, J. T. Jang, S. Choi, H. Kang, J. Kim, H. R. Yu, G. Ahn, J. Lee, S.-J. Choi, D. M. Kim, and D. H. Kim*"Comparative study on the structural dependence of the sensitivity InGaZnO photosensors"The 24th Korean Conference on Semiconductors, 2017-02
81 G. Ahn, J. T. Jang, D. Ko, H. Yu, S.-J. Choi, D. M. Kim, and D. H. Kim*"The influence of oxygen-content on the synaptic behavior of InGaZnO memristors for neuromorphic applications"The 24th Korean Conference on Semiconductors, 2017-02
80H. Lee, J. Kim, J. Kim, S. K. Kim, S.-J. Choi, D. H. Kim and D. M. Kim*"Characterization of Photo-Responsive Mechanism through Subgap Density-of-States in a-IGZO TFTs for Possible Infrared Light Detection"The 24th Korean Conference on Semiconductors, 2017-02
79J. Jang, J. Kim, H.-S. Mo, J. Park, B.-G. Park, S.-J. Choi, D. M. Kim, and D. H. Kim*"Experimental analysis on the setup/hold time in readout condition of Si nanowire FET-based biosensors for detecting ion and/or biomolecule in analyte solution"The 24th Korean Conference on Semiconductors, 2017-02
78J. Kim, H. Lee, H. Bae, O. Seok, S.-J. Choi, D. H. Kim, and D. M. Kim"Characterization of Heterojunction Interface Traps in AlGaN/GaN HEMTs through Sub-Bandgap Photonic Response and Subthreshold Ideality Factor"The 24th Korean Conference on Semiconductors, 2017-02
77S. K. Kim, J.-P. Shim, D.-M. Geum, C. Z. Kim, H.-S. Kim, Y.-S. Kim, H.-K. Kang, J.-D. Song, S.-J. Choi, D. H. Kim, W. J. Choi, H.-j. Kim, D. M. Kim* and S. H. Kim*"Fabrication of In-Rich(>0.53) InGaAs-OI on Si by Novel Epitaxial Lift-Off"The 24th Korean Conference on Semiconductors, 2017-02
76S. K. Kim, J.-P. Shim, D.-M. Geum, C. Z. Kim, H.-S. Kim, Y-S Kim, H.-K. Kang, J.-D. Song, S.-J. Choi, D. H. Kim, W. J. Choi, H.-J Kim, D. M. Kim* and S.-H. Kim*"High-performance In0.53Ga0.47As-OI MOSFET on Si substrates"The 24th Korean Conference on Semiconductors, 2017-02
75S. K. Kim, J. Shim, D.-M. Geum, C. Z. Kim, H.-S. Kim, Y.-S. Kim, H.-K. Kang, J. D. Song, S.-J. Choi, D. H. Kim, W. J. Choi, H.-J Kim, D. M. Kim*, S. H. Kim1* (*co-corresponding authors)"Cost-effective Fabrication of In0.53Ga0.47As-on-Insulator on Si for Monolithic 3D via Novel Epitaxial Lift-Off (ELO) and Donor Wafer Re-use"IEEE International Electron Device Meeting (IEDM), 2016-09
74D. Lee, B.-H. Lee, J. Yoon, B. Choi, J.-Y. Park, D.-C. Ahn, C.-K. Kim, B.-W. Hwang, S.-B. Jeon, H. J. Ahn, M.-L. Seol, M.-H. Kang, B. J. Cho, S.-J. Choi*, Y.-K. Choi* (*co-corresponding authors)"First Demonstration of a Wrap-Gated CNT-FET with Vertically-Suspended Channels"IEEE International Electron Device Meeting (IEDM), 2016-09
73M. Lim, J. Lee, D. H. Kim, D. M. Kim, S. Kim, S.-J. Choi"Comparative Study of Piezoresistance Effect of Semiconducting Carbon Nanotube-Polydimethylsiloxane Nanocomposite Strain Sensor"16th International Conference on Nanotechnology, 2016-08
72H. Kang, J. T. Jang, S. Choi, J.-Y. Kim, D. Ko, S.-J. Choi, D. M. Kim, D. H. Kim"Wavelength-dependence of Persistent Photoconductivity in Zinc Oxynitride Thin-Film-Transistors"IMID 2016 DIGEST, 2016-08
71S. Choi, J. Kim, J. Kim, J. T. Jang, H. Kang, J.-Y. Kim, D. Ko, D. M. Kim, S.-J. Choi, J. C. Park, D. H. Kim"Temperature-dependency of the Donor Creation under Positive Gate and Drain Bias Stress in Self-Aligned Top-Gate a-InZnO TFTs"IMID 2016 DIGEST, 2016-08
70B. Choi, S. H. Jang, J. Yoon, J. Lee, M. Jeon, Y. Lee, J. Han, J. Lee, D. M. Kim, D. H. Kim, C. Lim, S. Park, S.-J. Choi"Comprehensive evaluation of early retention (fast charge loss within a few seconds) characteristics in tube-type 3-D NAND Flash Memory"Symposium on VLSI Technology Digest of Technical Papers (VLSI), 2016-06
69D. Ko, J. T. Jang, Y.-J. Baek, S.-J. Choi, D. M. Kim, C. J. Kang, T.-S. Yoon, H.-S. Mo, D. H. Kim"Effects of ambient and photo-illumination on electrical characteristics in the γ-Fe2O3 nanoparticle assembly-based memristors"The 23st Korean Conference on Semiconductors(KCS 2016), p. 237, 2016-02
68H. Kang, J. T. Jang, S. Choi, S.-J. Choi, D. M. Kim, D. H. Kim"Analysis on the Degradation Mechanism under Positive/Negative Gate Bias Stress in Zinc Oxynitride Thin-Film Transistors"The 23st Korean Conference on Semiconductors(KCS 2016), p. 70, 2016-02
67J. Lee, B. Choi, J. Yoon, M. Jeon, Y. Lee, J. Han, J. Lee, D. M. Kim, D. H. Kim, S.-J. Choi"Ink-jet printed ambipolar transistors and inverters based on semiconducting carbon nanotubes with chemical doping technique"The 23st Korean Conference on Semiconductors(KCS 2016), p. 54, 2016-02
66J. Jang, J. Kim, H.-S. Mo, J. H. Lee, B.-G. Park, S.-J. Choi, D. M. Kim, D. H. Kim, J. Park"Analysis and modeling on the pH-dependent current drift of Si nanowire ion-sensitive field effect transistor (ISFET)-based biosensors"The 23st Korean Conference on Semiconductors(KCS 2016), p. 154, 2016-02
65J. Han, B. Choi, J. Yoon, J. Lee, M. Jeon, Y. Lee, J. Lee, D. M. Kim, D. H. Kim, S.-J. Choi"A capacitorless 1T-DRAM cell on independent double-gate FinFET"The 23st Korean Conference on Semiconductors(KCS 2016), p. 238, 2016-02
64J. T. Jang, S.-J. Choi, D. M. Kim, D. H. Kim"Calculation Method for Negative Bias Illumination Stress-induced Instability in Amorphous IGZO Thin-Film Transistors"The 23st Korean Conference on Semiconductors(KCS 2016), p. 41, 2016-02