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  • 44 K. S. Roh, G.-C. Kang, S. H. Seo, K. Y. Kim, K.-J. Song, J.-H. Park, S. Lee, C. M. Choi, K. Jeon, S. R. Park, J. Lee, T. Y. Kim, D. H. Kim , and D. M. Kim "Novel Flat Band Voltage Extraction using Optical Substrate Current and Lateral Profiling of Trapped Charges in Localized Charge Trapping Flash Memory Cells" The 15th Korean Conference on Semiconductors, 2008-02
  • 43 J.‐W. Han S.‐W. Ryu, S. Kim, C.‐J. Kim, M. Im, S.‐J. Choi, J. S. Kim, K. H. Kim, J. S. Oh, M. H. Song, G. S. Lee, Y. C. Park, J. W. Kim, and Y.‐K. Choi "A Unified‐RAM (URAM) Cell Multi‐Functioning Capacitorless DRAM and NVM" IEEE International Electron Device Meeting (IEDM), pp. 929‐032, 2007-12
  • 42 S. Y. Lee, J. U. Lee, S. H. Seo, K. S. Roh, G. C. Kang, K. Y. Kim, C. M. Choi, K. J. Song, S. R. Park, K. C. Jeon, J. H. Park, C. H. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M. Kim "Extraction Method of the Interface and Nitride Trap Density in Nitride-Based Charge Trapped Flash Memories Using an Optical Response" 2007 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices, pp. 225-228, 2007-06
  • 41 S. W. Kim, J. U. Lee, K. S .Roh, G. C. Kang, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M. "Characterization of Tunnel Oxide Degradation under NAND-type Program/Erase Stresses of SONOS Flash Memory Cell Transistors with 30 nm" The 14th Korean Conference on Semiconductors, Vol. 2, pp. 1023-1024, 2007-02
  • 40 J. U. Lee, S. W. Kim, K. S .Roh, G. C. Kang, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M. "Extraction of Si3N4 Trap Density Distribution in SONOS Flash Memories based on Optical C-V Method" The 14th Korean Conference on Semiconductors, Vol. 1, pp. 65-66, 2007-02
  • 39 Lee, S. Y, S. H. Seo, K. S .Roh, J. U. Lee, S. W. Kim, G. C. Kang, K. Y. Kim, C. H. Lee, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, "Extraction of the Interface Trap Density in SONOS Flash Memory Cell Transistors by Optical Subthreshold Current Method" The 14th Korean Conference on Semiconductors, Vol. 2, pp. 1041-1042, 2007-02
  • 38 K. Y. Kim, K. S .Roh, G. C. Kang, S. H. Seo, S. W. Kim, C. H. Lee, J. U. Lee, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M. "Halo Doping-Dependence and Structural Optimization of Short Channel Effects in Partially Insulated MOSFETs(PiFETs)" The 14th Korean Conference on Semiconductors, Vol. 2, pp. 1085-1086, 2007-02
  • 37 K. S .Roh, S. H. Seo, S. Y. Lee, J. U. Lee, S. W. Kim, G. C. Kang, K. Y. Kim, C. H. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M. "Lateral Profiling of Interface States in SONOS Flash Memories Using the Optical Charge Pumping Method" The 14th Korean Conference on Semiconductors, Vol. 2, pp. 1045-1046, 2007-02
  • 36 S. H. Seo, S. W. Kim, J. U. Lee, C. H. Lee, G. C. Kang, K. S .Roh, K. Y. Kim, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M. "Narrow Width Effect of an NROM-type SONOS Flash Memory Device on Program/Erase Cycling Behavior" The 14th Korean Conference on Semiconductors, Vol. 1, pp. 67-68, 2007-02
  • 35 K.-P Kang, K.-M. Kang, D.-K. Kwak, O-S. Kwon, D.-H. Lee, J.-G. Lee, D. M. Kim, D. J. Kim, H.-J. Song, D. H. Kim, and D.-S. Min "Low-Power Dynamic VTH Scaling (DVTS) Circuits using Charge-Recycling Technique for Leakage-Dominant VLSI’s"" International SoC Design Conference, pp. 361-364, 2006-10
  • 34 Y. S. Yu, D. H. Kim, J. D. Lee, and B.-G. Park "Transport Spectroscopy of A Quantum Dot in SOI MOSFET"" The 13th International Symposium on the Physics of Semiconductors and Applications, p. 116, 2006-08
  • 33 J.-U. Lee, K.-H. Baek, C. Olson, D. M. Kim, and A. Gopinath "Simulation of Self-assembled Photonic Crystals with Embedded Waveguide Using FDTD Method" Progress in Electromagnetic Research Symposium(PIERS), Cambridge, Massachusetts, 2006-03
  • 32 강경필, 최훈대, 강경민, 곽동곤, 권오삼, 김대환, 송호준, 김대정, 김동명, 민경식 "Charge-Recycling Dynamic VTH Scaling (DVTS) Circuit for Leakage-Dominant VLSI’s" The 13th Korean Conference on Semiconductors, vol. 1, pp. 173-174, 2006-02
  • 31 곽동곤, 최훈대, 강경민, 권오삼, 김대환, 송호준, 김대정, 김동명, 민경식 "Row-By-Row Activated SRAM with Process-VDD-Temperature (PVT) Fluctuation Adaptive Source-Line Biasing Circuit for Low-Leakage Sub-70-nm LSI’s" The 13th Korean Conference on Semiconductors, vol. 1, pp. 199-200, 2006-02
  • 30 강경민, 최훈대, 강경필, 곽동곤, 권오삼, 임진혁, 김대환, 송호준, 김대정, 김동명, 민경식 "FPGA Implementation of Multi-Channel SDRAM Controller" The 13th Korean Conference on Semiconductors, vol. 1, pp. 579-582, 2006-02
  • 29 강경민, 최훈대, 강경필, 곽동곤, 권오삼, 임진혁, 김대환, 송호준, 김대정, 김동명, 민경식 "Low-Latency and High-Bandwidth Multi-Channel SDRAM Controller Using Predictive Reordering Scheme for Multimedia SoC" The 13th Korean Conference on Semiconductors, vol. 2, pp. 925-926, 2006-02
  • 28 J. B. Choi, S. W. Kim, K. S. Roh, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, J. U. Lee, G. C. Kang, H. T. Kim, D. H. Kim, K. S. Min, D. J. Kim, and D. M. Kim "Optical Trap-Assisted Tunneling Current Method for Extracting thr Interface-State Density in the Gate-to-Drain Overlapped Region of MOSFETs" The 13th Korean Conference on Semiconductors, vol. 2, pp. 817-818, 2006-02
  • 27 J. B. Choi, S. W. Kim, K. S. Roh, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, J. U. Lee, G. C. Kang, H. T. Kim, D. H. Kim, K. S. Min, D. J. Kim, and D. M. Kim "Optical Trap-Assisted Tunneling Current Method for Extracting thr Interface-State Density in the Gate-to-Drain Overlapped Region of MOSFETs" The 13th Korean Conference on Semiconductors, vol. 2, pp. 817-818, 2006-02
  • 26 S. W. Kim, J. B. Choi, K. S. Roh, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, J. U. Lee, G. C. Kang, H. T. Kim, D. H. Kim, K. S. Min, D. J. Kim, and D. M. Kim "Sub-Bandgap Photonic Base Current Method for Extracting the Trap Density at Hetero-Interface in Heterojunction Bipolar Transistors" The 13th Korean Conference on Semiconductors, vol. 1, pp. 153-154, 2006-02
  • 25 최재복, 김세운, 서승환, 김관영, 강구철, 이장욱, 이충현, 노강섭, 이순영, 김해택, 김대환, 민경식, 김대정, 김동명 "Characterization of interface states in the gate-to-drain overlapped region of MOSFETs using GIDL current under sub-bandgap photonic excitation" IT-SOC conference(한국소프트웨어진흥원), pp. 455-457, 2005-11
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