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  • 127 H. Seo, H. Bae, C. Jo, E. Hong, H. Choi, J. S. Hwang, J. Ahn, D. H. Kim, and D. M. Kim "Characterization of Free Electron-Deembedded Subgab Density-of-States in a-IGZO TFTs from the Sub-Bandgap Optical Subthreshold Characteristics" The 20th Korean Conference on Semiconductors, 2013-02
  • 126 C. Jo, S. Jun, W. Kim, I. Hur, J. Jang, J. Kim, J. Lee, Y. H. Kim, H. Bae, D. J. Shin, K. M. Lee, H. Kim, D. H. Kim, and D. M. Kim "Characterization of Negative Bias Stress Instability Mechanisms in Amorphous InGaZnO Thin Film Transistors" The 20th Korean Conference on Semiconductors, 2013-02
  • 125 J. Jang, J. Kim, J. Lee, H. Kim, D. M. Kim, and D. H. Kim "Density-of-States (DOS)-based I-V and C-V Models and Link to Circuit Simulator for Polymer Thin Film Transistors (PTFTs)" The 20th Korean Conference on Semiconductors, 2013-02
  • 124 W. H. Lee, J.-M. Lee, M. Uhm, J. Lee, J. H. Lee, H. Bae, E. Hong, S. Hwang, Y. H. Kim, B. S. Choi, B.-G. Park, D. M. Kim, Y.-J. Jeong, and D. H. Kim "Characterization of Subthreshold Slope Degradation in CMOS-based Silicon Nanowire Biosensors" The 20th Korean Conference on Semiconductors, 2013-02
  • 123 J. Lee, J. H. Lee, M. Uhm, W. H. Lee, S. Hwang, B. S. Choi, B.-G. Park ,D. M. Kim, and D. H. Kim "Implementation and Characterization of Gate-Induced Drain Leakage Current-Based Multiplexed SiNW Biosensor" The 20th Korean Conference on Semiconductors, 2013-02
  • 122 S. Hwang, J. Lee, W. H. Lee, M. Uhm, B. S. Choi, H. Bae, S. Oh, Y. Kim, H. H. Lee, D. M. Kim, and D. H. Kim "Detection of a Specific Target DNA through the Threshold Voltage Shift in Silicon Nanowire FET-based Biosensors" The 20th Korean Conference on Semiconductors, 2013-02
  • 121 H. Bae, H. Choi, S. Jun, C. Jo, Y. H. Kim, J. Lee, S. Hwang, Euiyeon Hong, I. Hur, J. S. Hwang, J. Ahn, D. G. Kim, B. S. Choi, S. Oh, D.-H. Kim, J. Bae, and D. M. Kim "Monochromatic Photonic Capacitance-Voltage Technique for Donor- and Acceptor-Like Density-of-States over the Full-Energy Range in Amorphous TFTs" The 20th Korean Conference on Semiconductors, 2013-02
  • 120 J. Lee, J. Jang, J. Kim, S. Jun, C. Jo, Y. H. kim, W. Kim, I. Hur, H. Kim, K. M. Lee, D. J. Shin, D. M. Kim, and D. H. Kim "Negative Bias Stress Instability Mechanism in Polymer-Based Thin-Film TransistorsThe 20th Korean Conference on Semiconductors" The 20th Korean Conference on Semiconductors, 2013-02
  • 119 H. Bae, H. Choi, S. Jun, C. Jo, Y. H. Kim, J. Lee, S. Hwang, E. Hong, I. Hur, D. J. Shin, K. M. Lee, H. Kim, S. Oh, D.-H. Kim, J. Bae, and D. M. Kim "Photonic Capacitance-Voltage Technique for Intrinsic Subgap-DOS Considering the Parasitic Capacitance in Amorphous Oxide Semicondctors" The 20th Korean Conference on Semiconductors, 2013-02
  • 118 김윤혁, 김대근, 황인록, 장재만, 배학열, 이재욱, 전성우, 조춘형, 최현준, 최선웅, 민경식, 박배호, 김동명, 김대환 "Simple Empirical I-V Model for Memristive Switches and Its Application for SPICE" The 20th Korean Conference on Semiconductors, 2013-02
  • 117 J.-H. Bae, M. Jang, C. H. Park, B.-G. Park, and J.-H Lee "Characterization of low frequency noise in PtSi source/drain Schottky barrier junction SOI MOSFETs" The 20th Korean Conference on Semiconductors (KCS), 2013-02
  • 116 D.-I. Moon, S.-J. Choi, J.-Y. Kim, S.-W. Ko, M.-S. Kim, J.-S. Oh, G.-S. Lee, M.-H. Kang, Y.-S. Kim, J.-W. Kim, and Y.-K. Choi* (*co-corresponding authors) "Highly Endurable Floating Body Cell Memory: Vertical Biristor" IEEE International Electron Device Meeting (IEDM), 2012-12
  • 115 J.-H. Bae, I. Hwang, J.-M. Shin, H.-I. Kwon, C. H. Park, J. Ha, J. Lee,H. Choi, J. Kim, J.-B. Park, J. Oh, J. Shin, U-I. Chung, and J.-H. Lee "Characterization of Traps and Trap-Related Effects in Recessed-Gate Normally-off AlGaN/GaN-based MOSHEMT" 2012 International Electron Devices Meeting (IEDM), 2012-12
  • 114 M.-K. Jeong, S.-M. Joe, B.-S. Jo, H.-J. Kang, J.-H. Bae, K.-R. Han, E. Choi, G. Cho, S.-K. Park, B.-G. Park, and J.-H Lee "Characterization of traps in 3-D stacked NAND flash memory devices with tube-type poly-Si channel structure" 2012 International Electron Devices Meeting (IEDM), 2012-12
  • 113 Y.-S. Kim, H.-H. Nahm, and D. H. Kim "Microscopic Mechanism of the Negative Bias and Illumination Stress Instability of Amorphous Oxide TFTs" in SID'12 Dig. Tech. Papers, 2012-05
  • 112 H. K. Jeong, I. Hur, W. Kim, J. Kim, D. Kong, Y. Kim, M. Bae, S. Choi, D. M. Kim, and D. H. Kim "Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors" in SID'12 Dig. Tech. Papers, 2012-05
  • 111 D. H. Kim, W. Kim, Y. Kim, I. Hur, M. Bae, D. Kong, H. K. Jeong, D. M. Kim "Physical Model and Simulation Platform for High-Level Instability-Aware Design of Amorphous Oxide Semiconductor Thin-Film Transistors" in SID'12 Dig. Tech. Papers, 2012-05
  • 110 H. Bae, D. Kong, J. S. Shin, D. Yun, E. Hong, H. Seo, H. Choi, J. Lee, H.-K. Jung, M. Bae, Y. Kim, W. Kim, D. H. Kim, and D. M. Kim "Active Layer Thickness-Dependent Parasitic Resistance Effect in Low Frequency Noise with Subgap Density-of-States in Amorphous Indium-Gallium-Zinc-Oxide TFTs" The 19th Korean Conference on Semiconductors, 2012-02
  • 109 정현광, 공동식, 김용식, 배민경, 김재형, 김우준, 허인석, 이재욱, 김윤혁, 전성우, 조춘형, 김동명, 김대환 "Amorphous Silicon 박막트랜지스터의 Negative Bias Illumination Stress 하에서의 물리적 Parameter 기반 신뢰성 특성 분석" The 19th Korean Conference on Semiconductors, 2012-02
  • 108 김우준, 배민경, 김용식, 김재형, 허인석, 장재만, 정현광, 공동식, 김윤혁 이재욱, 조춘형, 전성우, 김동명, 김대환 "Analytical Model-based SPICE Simulation ofr the Design of Amorphous InGaZnO Thin-Film Transistors-based Circuits" The 19th Korean Conference on Semiconductors, 2012-02
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