127H. Seo, H. Bae, C. Jo, E. Hong, H. Choi, J. S. Hwang, J. Ahn, D. H. Kim, and D. M. Kim"Characterization of Free Electron-Deembedded Subgab Density-of-States in a-IGZO TFTs from the Sub-Bandgap Optical Subthreshold Characteristics"The 20th Korean Conference on Semiconductors, 2013-02
126C. Jo, S. Jun, W. Kim, I. Hur, J. Jang, J. Kim, J. Lee, Y. H. Kim, H. Bae, D. J. Shin, K. M. Lee, H. Kim, D. H. Kim, and D. M. Kim"Characterization of Negative Bias Stress Instability Mechanisms in Amorphous InGaZnO Thin Film Transistors"The 20th Korean Conference on Semiconductors, 2013-02
125J. Jang, J. Kim, J. Lee, H. Kim, D. M. Kim, and D. H. Kim"Density-of-States (DOS)-based I-V and C-V Models and Link to Circuit Simulator for Polymer Thin Film Transistors (PTFTs)"The 20th Korean Conference on Semiconductors, 2013-02
124W. H. Lee, J.-M. Lee, M. Uhm, J. Lee, J. H. Lee, H. Bae, E. Hong, S. Hwang, Y. H. Kim, B. S. Choi, B.-G. Park, D. M. Kim, Y.-J. Jeong, and D. H. Kim"Characterization of Subthreshold Slope Degradation in CMOS-based Silicon Nanowire Biosensors"The 20th Korean Conference on Semiconductors, 2013-02
123J. Lee, J. H. Lee, M. Uhm, W. H. Lee, S. Hwang, B. S. Choi, B.-G. Park ,D. M. Kim, and D. H. Kim"Implementation and Characterization of Gate-Induced Drain Leakage Current-Based Multiplexed SiNW Biosensor"The 20th Korean Conference on Semiconductors, 2013-02
122S. Hwang, J. Lee, W. H. Lee, M. Uhm, B. S. Choi, H. Bae, S. Oh, Y. Kim, H. H. Lee, D. M. Kim, and D. H. Kim"Detection of a Specific Target DNA through the Threshold Voltage Shift in Silicon Nanowire FET-based Biosensors"The 20th Korean Conference on Semiconductors, 2013-02
121H. Bae, H. Choi, S. Jun, C. Jo, Y. H. Kim, J. Lee, S. Hwang, Euiyeon Hong, I. Hur, J. S. Hwang, J. Ahn, D. G. Kim, B. S. Choi, S. Oh, D.-H. Kim, J. Bae, and D. M. Kim"Monochromatic Photonic Capacitance-Voltage Technique for Donor- and Acceptor-Like Density-of-States over the Full-Energy Range in Amorphous TFTs"The 20th Korean Conference on Semiconductors, 2013-02
120J. Lee, J. Jang, J. Kim, S. Jun, C. Jo, Y. H. kim, W. Kim, I. Hur, H. Kim, K. M. Lee, D. J. Shin, D. M. Kim, and D. H. Kim"Negative Bias Stress Instability Mechanism in Polymer-Based Thin-Film TransistorsThe 20th Korean Conference on Semiconductors"The 20th Korean Conference on Semiconductors, 2013-02
119H. Bae, H. Choi, S. Jun, C. Jo, Y. H. Kim, J. Lee, S. Hwang, E. Hong, I. Hur, D. J. Shin, K. M. Lee, H. Kim, S. Oh, D.-H. Kim, J. Bae, and D. M. Kim"Photonic Capacitance-Voltage Technique for Intrinsic Subgap-DOS Considering the Parasitic Capacitance in Amorphous Oxide Semicondctors"The 20th Korean Conference on Semiconductors, 2013-02
118김윤혁, 김대근, 황인록, 장재만, 배학열, 이재욱, 전성우, 조춘형, 최현준, 최선웅, 민경식, 박배호, 김동명, 김대환"Simple Empirical I-V Model for Memristive Switches and Its Application for SPICE"The 20th Korean Conference on Semiconductors, 2013-02
117J.-H. Bae, M. Jang, C. H. Park, B.-G. Park, and J.-H Lee"Characterization of low frequency noise in PtSi source/drain Schottky barrier junction SOI MOSFETs"The 20th Korean Conference on Semiconductors (KCS), 2013-02
116D.-I. Moon, S.-J. Choi, J.-Y. Kim, S.-W. Ko, M.-S. Kim, J.-S. Oh, G.-S. Lee, M.-H. Kang, Y.-S. Kim, J.-W. Kim, and Y.-K. Choi* (*co-corresponding authors)"Highly Endurable Floating Body Cell Memory: Vertical Biristor"IEEE International Electron Device Meeting (IEDM), 2012-12
115J.-H. Bae, I. Hwang, J.-M. Shin, H.-I. Kwon, C. H. Park, J. Ha, J. Lee,H. Choi, J. Kim, J.-B. Park, J. Oh, J. Shin, U-I. Chung, and J.-H. Lee"Characterization of Traps and Trap-Related Effects in Recessed-Gate Normally-off AlGaN/GaN-based MOSHEMT"2012 International Electron Devices Meeting (IEDM), 2012-12
114M.-K. Jeong, S.-M. Joe, B.-S. Jo, H.-J. Kang, J.-H. Bae, K.-R. Han, E. Choi, G. Cho, S.-K. Park, B.-G. Park, and J.-H Lee"Characterization of traps in 3-D stacked NAND flash memory devices with tube-type poly-Si channel structure"2012 International Electron Devices Meeting (IEDM), 2012-12
113Y.-S. Kim, H.-H. Nahm, and D. H. Kim"Microscopic Mechanism of the Negative Bias and Illumination Stress Instability of Amorphous Oxide TFTs"in SID'12 Dig. Tech. Papers, 2012-05
112H. K. Jeong, I. Hur, W. Kim, J. Kim, D. Kong, Y. Kim, M. Bae, S. Choi, D. M. Kim, and D. H. Kim"Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors"in SID'12 Dig. Tech. Papers, 2012-05
111D. H. Kim, W. Kim, Y. Kim, I. Hur, M. Bae, D. Kong, H. K. Jeong, D. M. Kim"Physical Model and Simulation Platform for High-Level Instability-Aware Design of Amorphous Oxide Semiconductor Thin-Film Transistors"in SID'12 Dig. Tech. Papers, 2012-05
110H. Bae, D. Kong, J. S. Shin, D. Yun, E. Hong, H. Seo, H. Choi, J. Lee, H.-K. Jung, M. Bae, Y. Kim, W. Kim, D. H. Kim, and D. M. Kim"Active Layer Thickness-Dependent Parasitic Resistance Effect in Low Frequency Noise with Subgap Density-of-States in Amorphous Indium-Gallium-Zinc-Oxide TFTs"The 19th Korean Conference on Semiconductors, 2012-02
109정현광, 공동식, 김용식, 배민경, 김재형, 김우준, 허인석, 이재욱, 김윤혁, 전성우, 조춘형, 김동명, 김대환"Amorphous Silicon 박막트랜지스터의 Negative Bias Illumination Stress 하에서의 물리적 Parameter 기반 신뢰성 특성 분석"The 19th Korean Conference on Semiconductors, 2012-02
108김우준, 배민경, 김용식, 김재형, 허인석, 장재만, 정현광, 공동식, 김윤혁 이재욱, 조춘형, 전성우, 김동명, 김대환"Analytical Model-based SPICE Simulation ofr the Design of Amorphous InGaZnO Thin-Film Transistors-based Circuits"The 19th Korean Conference on Semiconductors, 2012-02